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IEEE Transactions on Applied Superconductivity

High-Accuracy InductEx Calibration Sets for MIT-LL SFQ4ee and SFQ5ee Processes

Coenrad Johann Fourie, Claudio Shawawreh, I. V. Vernik, Timur V. Filippov

Published Jan 24, 2017• 28 citations
Publisher

Abstract

The MIT Lincoln Lab SFQ4ee and SFQ5ee process nodes, targeted at energy-efficient superconducting digital circuits, allow the fabrication of complicated multilayer circuit structures. Published per-length inductance values do not hold if ground plane (GP) and sky plane (SP) combinations are changed, or if inductance is distributed over multiple via-connected layers with current return paths determined by the specific placement of sky-to-ground vias. A three-dimensional inductance extraction tool, InductEx, can handle extraction from such complicated multilayer structures with holes in the GPs and SPs. We present calibrated parameter sets for InductEx generated from the analysis of twelve representative test structures. We show that the root-mean-squared-error (RMSE) between InductEx extractions and averaged experimental measurements of self-inductance are below 1% for several calibration sets-The lowest ever reported. The RMSE between calculations and measurements for mutual inductance is also below 1% for the best calibration set-A level also never achieved before.

DOI
10.1109/tasc.2017.2657608

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The MIT Lincoln Lab SFQ4ee and SFQ5ee process nodes, targeted at energy-efficient superconducting digital circuits, allow the fabrication of complicated multilayer circuit structures. Published per-length inductance values do not hold if ground plane (GP) and sky plane (SP) combinations are changed, or if inductance is distributed over multiple via-connected layers with current return paths determined by the specific placement of sky-to-ground vias. A three-dimensional inductance extraction tool, InductEx, can handle extraction from such complicated multilayer structures with holes in the GPs and SPs. We present calibrated parameter sets for InductEx generated from the analysis of twelve representative test structures. We show that the root-mean-squared-error (RMSE) between InductEx extractions and averaged experimental measurements of self-inductance are below 1% for several calibration sets-The lowest ever reported. The RMSE between calculations and measurements for mutual inductance is also below 1% for the best calibration set-A level also never achieved before.
Abstract Currently, fabrication processes for superconductive integrated circuits are moving to multiple wiring and shielding layers, some of which are placed below the main ground plane (GP) and device layers. The Advanced Industrial Science and Technology advanced process (ADP2) was the first such multi-layer Nb process with planarized passive transmission line and GP layers below the junction layer, and is at the time of writing still the most developed. This process allows complex circuit designs, and accurate inductance extraction helps to push the boundaries of the layouts possible. We show that the position of ground connections between ground layers influences the inductance of structures for which these GPs act as return path, and that this needs to be accounted for in modelling. However, due to the number of wiring layers and GPs, full layout modelling of large cells causes long calculation times. In this paper we discuss methods with which to reduce model size, and calibrate InductEx calculations using these methods against measured results. We show that model reduction followed by calibration results in fast calculation times while good accuracy is maintained. We also show that InductEx correctly handles coupling between conductors in a multi-layer layout, and how to model layouts to gauge unwanted coupling between power lines and single flux quantum electronics.
Abstract Data are presented on the inductance of various features used in superconductor digital integrated circuits: microstrip and stripline inductors with linewidths down to 120 nm and different combinations of ground plane layers, effect of perforations of various sizes in the ground planes and their distance to the inductors on inductance, inductance of vias of various sizes between adjacent layers, inductance of composite vias between distant superconducting layers. Test circuits used for the measurements were fabricated in a new 150 nm node of a fully planarized process with eight niobium layers developed at MIT Lincoln Laboratory for superconductor electronics as well as in our standard SFQ5ee and SC1 fabrication processes with 250 nm minimum feature size. The new SC2 process utilizes 193 nm photolithography in combination with plasma etching and chemical mechanical planarization of interlayer dielectrics to define inductors with linewidth down to about 100 nm on critical layers. The standard processes use 248 nm photolithography. The measured data are compared with the results of inductance extraction using software packages InductEx and wxLC. Variations of circuit inductors caused by the fabrication processes are discussed. Magnetic flux trapping in ground plane moats and its coupling to nearby inductors are discussed for circuit cooling in a residual field of several configurations.
The design of single flux-quantum (SFQ) circuits requires well-defined inductances. In many cases these are created by irregular geometries and a computer-aided design tool is necessary for inductance calculations. This becomes a challenging task in cases where no ground plane is used and thus three-dimensional calculations are required. For this purpose, InductEx was developed and verified successfully for simple structures. In this work we take the next step and demonstrate the applicability of InductEx to the design of rapid single flux-quantum (RSFQ) cells. We use InductEx for inductance modeling as an integral part of the design cycle for an RSFQ cell with flux quantum transfer via mutual inductance and for a DC-reprogrammable logic circuit with similar inductive coupling. The relation between coupling factor and self-inductance is optimized in the circuit layout. All coupling structures are duplicated in SQUID modulation test circuits to measure and verify calculation accuracy. We find excellent agreement between the calculated and measured inductance values. Furthermore, the operational area of the basic cell is determined and compared with similar investigations reported earlier. Based on this comparison we conclude that InductEx is a valuable inductance design tool, and that mutual coupling in structures using ground plane holes and RSFQ-compatible self-inductances can be modeled and designed reliably.
Data are presented on mutual and self-inductance of various inductors used in multilayered superconductor integrated circuits: microstrips and striplines with widths from 250 nm to a few micrometers, located on the same layer at various distances from each other, from 250 nm to a few micrometers, and/or on different layers spaced vertically; effect of long slits in the ground plane(s) along the inductors on their mutual inductance; inductance of right-angled bends; and inductance of meanders. Measurements were done using circuits fabricated in the SFQ5ee and the SC1 fully planarized fabrication processes with eight niobium layers and Nb/Al-AlOx/Nb Josephson junctions, developed at MIT Lincoln Laboratory for superconductor electronics. Simple analytical expressions for mutual and self-inductance of the basic inductors are given, describing experimental data with accuracy better than 2% over a very wide range of parameters. Mutual coupling between microstrips is long-ranged and decreases as a second power of distance between them, making microstrips unsuitable for very large scale integrated circuits. Mutual inductance of striplines decreases exponentially with distance between them on a scale of(H+2λ)/π({\boldsymbol{H}} + 2{\boldsymbol{\lambda }})/{\boldsymbol{\pi }}(H+2λ)/π∼ 0.3 μm, whereH{\boldsymbol{H}}Handλ{\boldsymbol{\lambda }}λare, respectively, the distance between and magnetic field penetration depth in superconducting ground planes, whereas superconducting properties of the signal traces are practically irrelevant. This decay distance determines the scale of integration above which adjacent inductors in a circuit become strongly coupled. Dependence of mutual inductance on the linewidth of wires is weak. As a result, the area of flux transformers—an essential component of all superconductor digital circuits using ac power, qubits, and sensor arrays—scales poorly with the linewidth, potentially restricting scalability of the circuits.
Inductance of superconducting thin-film inductors and structures with linewidth down to 250 nm has been experimentally evaluated. The inductors include various striplines and microstrips, their 90° bends and meanders, interlayer vias, etc., typically used in superconducting digital circuits. The circuits have been fabricated by a fully planarized process with 8 niobium layers, developed at MIT Lincoln Laboratory for very-large-scale superconducting integrated circuits. Excellent run-to-run reproducibility and inductance uniformity of better than 1% across 200-mm wafers have been found. It has been found that the inductance per unit length of stripline and microstrip line inductors continues to grow as the inductor linewidth is reduced deep into the submicron range to the widths comparable to the film thickness and magnetic field penetration depth. It is shown that the linewidth reduction does not lead to widening of the parameter spread due to diminishing sensitivity of the inductance to the linewidth and dielectric thickness. The experimental results were compared with numeric inductance extraction using commercial software and freeware, and a good agreement was found for 3-D inductance extractors. Methods of further miniaturization of circuit inductors for achieving circuit densities> 106Josephson junctions per cm2are discussed.
At present, superconducting integrated circuit layouts are verified through a variety of techniques. A layout-versus-schematic method implemented in Cadence allows extraction of circuit schematics with certain geometry-dependent parameters. Lmeter calculates inductance in a layout network and, with proper setup, may also calculate resistance separately. Recently, InductEx was introduced to calculate multiterminal network inductance in a superconductor structure with support for more complicated 3-D geometries. Here, we present an improvement to InductEx that allows resistance, inductance, and Josephson junction critical current extraction of a full superconducting digital logic gate or cell in a single execution, as well as in reasonable time. We show how InductEx was designed to operate on tape-out ready layouts and, through example, how it is used for full-gate layout verification of contemporary logic cells.