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Proceedings of the Society Conference of IEICE

Consideration of BER of Josephson Latching Drivers for SFQ Systems

Y. Yamashiro, N. Harada, Koji Fujiwara, Nobuyuki Yoshikawa, Shinichi Yorozu

Published Sep 10, 2003• 0 citations
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A new Josephson latching driver with a current-injection device at an input port has been developed and tested. It has high input sensitivity and a wide bias margin. Under an optimal bias condition, the bit-error rate (BER) of this driver is below 10/sup -12/ at data rates of 5 and 10 Gb/s. The driver can be switched by superconducting single-flux quantum (SFQ) pulse input and can be used as an amplifier to test the BER of SFQ circuits. In such a test, the BER of an SFQ converter operating at 5 Gb/s was less than 10/sup -12/ with bias margin of /spl plusmn/20%.
The adiabatic quantum flux parametron (AQFP) is an energy-efficient, high-speed superconducting logic device. To observe the tiny output currents from the AQFP in experiments, high-speed voltage drivers are indispensable. In the present study, we develop a compact voltage driver for AQFP logic based on a Josephson latching driver (JLD), which has been used as a high-speed driver for rapid single-flux-quantum (RSFQ) logic. In the JLD-based voltage driver, the signal currents of AQFP gates are converted into gap-voltage-level signals via an AQFP/RSFQ interface and a four-junction logic gate. Furthermore, this voltage driver includes only 15 Josephson junctions, which is much fewer than in the case for the previously designed driver based on dc superconducting quantum interference devices (60 junctions). In measurement, we successfully operate the JLD-based voltage driver up to 4 GHz. We also evaluate the bit error rate (BER) of the driver and find that the BER is 7.92×10-10 and 2.67×10-3 at 1GHz and 4GHz, respectively.