IEEE Transactions on Applied Superconductivity
Josephson Latching Driver With a Low Bit-Error Rate
N. Harada, Nobuyuki Yoshikawa, Akira Yoshida, Naoki Yokoyama
Abstract
A new Josephson latching driver with a current-injection device at an input port has been developed and tested. It has high input sensitivity and a wide bias margin. Under an optimal bias condition, the bit-error rate (BER) of this driver is below 10/sup -12/ at data rates of 5 and 10 Gb/s. The driver can be switched by superconducting single-flux quantum (SFQ) pulse input and can be used as an amplifier to test the BER of SFQ circuits. In such a test, the BER of an SFQ converter operating at 5 Gb/s was less than 10/sup -12/ with bias margin of /spl plusmn/20%.