IEEE Transactions on Applied Superconductivity
The Relationship Between Bit-Error Rate, Operating Speed and Circuit Scale of SFQ Circuits
Hirotaka Terai, Y. Hashimoto, Shinichi Yorozu, Akira Fujimaki, Nobuyuki Yoshikawa, Ziji Wang
Abstract
Timing jitter is an important constraint for the performance of SFQ circuits. We focus on the timing jitter in a Josephson transmission line (JTL) that induces timing errors at logic gates. A proper data analysis of 2-bit shift registers gave a jitter value of about 0.08 ps for a single Josephson junction in a JTL powered at a designed bias current. The variations in timing parameters of logic cells also give rise to timing errors. We experimentally determined the timing parameters in several logic cells and found that the deviations between actual and nominal values are within 2 ps. The relationship between the gray zone and circuit scale was estimated by extrapolating the transition curves observed in 2-bit shift registers. The estimated circuit scale was 20,000-100,000 JJs and 1,000 JJs at an operating clock frequency of 20 GHz and 40 GHz, respectively.