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Superconductor Science and Technology

SINIS fabrication process for realizing integrated circuits in RSFQ impulse logic

D Balashov, M. Khabipov, F-Im Buchholz, W. Kessel, J. Niemeyer

Published Nov 1, 1999• 11 citations
Publisher

Abstract

At PTB, a new type of fabrication process has been developed to verify rapid single flux quantum (RSFQ) integrated circuits based on intrinsically shunted two-tunnel Josephson junctions (JJs). The process has been realized in LTS implementation using SINIS technology. A variety of single JJs, junction arrays and test circuits have been fabricated and experimentally investigated. The critical current densities of the junctions were set to a nominal value of j C = 500 A cm -2 , with values of the characteristic voltage V C equal to or larger than 160 µV. The JJs show nearly hysteresis-free behaviour (less than 10%); the intrawafer parameter spread is smaller than ±10%. Various basic RSFQ circuits have been realized with operation margins of bias currents of larger than ±20%.

DOI
10.1088/0953-2048/12/11/351

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At PTB, a new type of fabrication process has been developed to verify rapid single flux quantum (RSFQ) integrated circuits based on intrinsically shunted two-tunnel Josephson junctions (JJs). The process has been realized in LTS implementation using SINIS technology. A variety of single JJs, junction arrays and test circuits have been fabricated and experimentally investigated. The critical current densities of the junctions were set to a nominal value of j C = 500 A cm -2 , with values of the characteristic voltage V C equal to or larger than 160 µV. The JJs show nearly hysteresis-free behaviour (less than 10%); the intrawafer parameter spread is smaller than ±10%. Various basic RSFQ circuits have been realized with operation margins of bias currents of larger than ±20%.
We have developed integrated circuits in rapid single flux quantum (RSFQ) impulse logic based on intrinsically shunted tunnel junctions as the active circuit elements. The circuits have been fabricated using superconductor-insulator-normalconductor-insulator-superconductor (SINIS) multilayer technology. The paper presents experimental results of the operation of various RSFQ circuits realized in different designs and layouts. The circuits comprise dc/SFQ and SFQ/dc converters, Josephson transmission lines (JTLs), T-flipflops, and analog key components. Functionality has been proved; the circuits have been found to operate correctly in switching. The circuits investigated have a critical current density of j/sub C/=400 A/cm/sup 2/ and a characteristic voltage of V/sub C/=165 /spl mu/V, the area of the smallest junction is A=24 /spl mu/m/sup 2/. The junctions exhibit nearly hysteresis-free current-voltage characteristics (hysteresis: less than 7%), the intra-wafer parameter spread for j/sub C/ is below /spl plusmn/8%. The margins of the bias current I/sub b/ of the circuits have been experimentally determined and found to be larger than /spl plusmn/24%. At preset, constant values of I/sub b/, the range of a separate bias current I/sub bsw/ fed to a switching stage integrated between two segments of JTL's is fully covered by the operation margins which are larger than /spl plusmn/56%.
At PTB, the fabrication process in Nb-Al/Al/sub x/O/sub y//Al/Al/sub x/O/sub y//Al-Nb SINIS multilayer technology has been improved to raise the characteristic voltage of SINIS two-tunnel Josephson junctions up to V/sub C/=I/sub C/R/sub n/=245 /spl mu/V. The process has been realized in LTS implementation. Various sets of the test wafers and wafers containing dc/SFQ and SFQ/dc converters, Josephson transmission lines, and T-flipflop circuits were fabricated and measured. The critical current densities of the junctions have been varied in the range from 70 A/cm/sup 2/ to 2.2 kA/cm/sup 2/ with corresponding characteristic voltages of V/sub C/=55 /spl mu/V and 245 /spl mu/V at the temperature of 4.2 K. The junctions show nearly hysteresis-free behaviour (less than 15%), the intra-wafer parameter spread is smaller than /spl plusmn/10%. RSFQ circuits have been realized with operation margins of the bias currents larger than /spl plusmn/20%.
The paper presents the determination of the high-frequency performance of Rapid Single Flux Quantum (RSFQ) circuits fabricated in superconductor-insulator-normal metal-insulator-superconductor (SINIS) technology. Circuits of different designs have been realized and were experimentally investigated, including specially designed T flip-flop (TFF) structures and circuits consisting of a switch terminated in Josephson transmission lines. For TFF circuits, the operational functionality was investigated in the frequency range from dc up to nearly 200 GHz. Two frequency domains were found. In the first domain, ranging up to frequencies of 80 GHz (f/sub C//spl cong/Y/sub C///spl Phi//sub 0/), correct digital operation of the device was ascertained. Beyond this range a second domain was found, ranging to nearly 200 GHz, for which quasi-analog frequency dividing is assumed. The bias current margins are /spl plusmn/30% at 40 GHz and /spl plusmn/15% between 130 GHz and 200 GHz. For circuits consisting of a switch, the operational functionality was proved in the frequency range from dc up to 50 GHz, with bias current margins of more than /spl plusmn/20%. The critical current density of the circuits is j/sub C//spl cong/750 A/cm/sup 2/. The smallest junction area is about A=12 /spl mu/m/sup 2/, and the characteristic voltage is V/sub C/=170 /spl mu/V.
Rapid Single-Flux-Quantum Circuits Fabricated Using 20-kA/cm2\hbox{20}\hbox{-}\hbox{kA}/\hbox{cm}^{2}20-kA/cm2 Nb/AlOx/Nb\hbox{Nb}/\hbox{AlO}_{x}/\hbox{Nb}Nb/AlOx​/Nb Process
We designed and fabricated rapid single-flux-quantum (RSFQ) circuits using a new 20-kA/cm2process based on conventional Nb/AlOx/Nb Josephson junction (JJ) technology. Circular JJs were fabricated to improve their uniformity. They had sufficiently low spread of the critical currents for large-scale RSFQ circuits. We selected the circuit design parameters carefully, including the bias voltage and McCumber-Stewart parameter, balancing the energy consumption, switching speeds, margins, and integration density. We demonstrated several logic gates and shift registers at a clock frequency of 154 GHz with the designed bias voltage of 2.5 mV, and demonstrated energy-efficient shift registers using the low-voltage RSFQ (LV-RSFQ) technique at 83 GHz.
At PTB, a fabrication process has been developed in SNS Nb/PdAu/Nb technology for the verification of small Josephson junctions (JJs) in the deep sub-micron range to enable the implementation of JJs as active elements in highly integrated superconducting circuits. Two steps of this technological development are described with regard to appropriately designed circuit layouts of JJ series arrays (JJAs), the first one in a conventional window type junction (WTJ) configuration and the second one in a ramp type junction (RTJ) configuration. Test circuits of JJAs containing up to 10 000 JJs have been fabricated and experimentally tested. In WTJ configuration, the circuits proved to be sensitive to external perturbing effects affecting the stability of circuit operation. In contrast to that, in RTJ configuration, the circuits realized showed correct function and a high grade of reliability of operation. To produce RTJ circuits, the technology parameters have been set to realize JJs with contact areas of A = 0.25 µm × 1.3 µm. At a thickness of the PdAu normal metal layer of d = 40 nm, the values achieved for the critical current density and for the product of critical current and normal state resistance are about jc = 200 kA cm-2 and about Ic RN = 21 µV.
We report on the fabrication and the operation of all-NbN rapid single flux quantum (RSFQ) circuits. The NbN integrated circuit consists of NbN/AlN/NbN tunnel junctions, Mo resistors, sputtered SiO/sub 2/ insulating layers, and 400-nm-thick NbN ground plane and wiring layer. The circuits were fabricated with the minimum junction size of 2 /spl mu/m/spl times/2 /spl mu/m and the alignment margin of +/-0.5 /spl mu/m. We designed RSFQ logic cells under critical current density of 2.5 kA/cm/sup 2/, sheet resistance of 2 /spl Omega/ and sheet inductance of 1.4 pH. We experimentally investigated dc bias margin of the fabricated RSFQ cells at 9 K. We observed relatively large dc bias margin of more than +/-25% for a pulse splitter, a confluence buffer and an RS flip-flop, while the dc bias margin of a T flip-flop was less than +/-5%. We succeeded to demonstrate the operation of 16-bit concurrent flow shift register at 9 K.