Micromachines
Vector Atomic Magnetometer with Free Induction Decay Detection Based on a Microfabricated Vapor Cell
Pengbo Jiang, Qi Li, Jianan Qin, Zhiyuan Jiang
Abstract
Atomic magnetometers are highly sensitive instruments widely used for measurements of weak magnetic field. Extracting vector information while maintaining high-precision scalar detection has become the trend in atomic magnetometer development. We introduce a vector atomic magnetometer containing a 5 mm-thick microfabricated vapor cell operating in free-induction-decay mode. By employing orthogonal modulation techniques, the system achieves high-precision in-plane vector magnetic field measurements. The high-precision vector magnetic field measurements are demonstrated in the x–z plane. The sensitivity of the total field detection in the miniaturized atomic magnetometer is 30 pT·Hz−1/2 @11 µT. The average angular error of the decoupled measurement is as low as 4.7 mrad @7.6 µT for vector magnetic fields, providing a new approach for vector magnetic field measurement in miniaturized atomic magnetometers.