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National Conference on Electrical and Electronics Engineering (ELECO)

Investigating the Use of Super Conducting Josephson Circuits for Microwave Power Measurements at Cryogenic Temperatures

Tezgül Coşkun Öztürk, Oliver Kieler

Published Nov 30, 2023• 1 citation
Publisher

Abstract

In this paper, the use of Josephson Arbitrary Waveform Synthesizer System's superconducting integrated circuit consisting of two Josephson Junctions arrays, for microwave power measurements is investigated. The critical current, the temperature dependent phenomena of the Josephson Junctions, is used to compare DC power and MW power reaching the neighbor array. Validation of the method is roughly demonstrated by measuring the attenuation of the waveguide used within the stick used to immerse the circuit to cryogenic environment. The attenuation of the waveguide is measured with the novel sensor and the conventional method. The preliminary results show 0.2 dB consistence of the attenuation measurements between the conventional and the novel method at different power levels at 1 GHz, that suggest that the method can be useful. To improve the repeatability and accuracy by automation, which is essential for such measurements, new power sensor is designed and presented.

DOI
10.1109/eleco60389.2023.10415971

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Accurate knowledge of the microwave power delivered to a cryogenic device under test (DUT) is essential for the characterization and operation of superconducting quantum circuits. However, this information is difficult to obtain inside dilution refrigerators because of distributed attenuation, impedance mismatch, switch-path repeatability, and temperature-dependent microwave components. This paper presents an in situ measurement method for RF power at the cryogenic device plane. The method uses a custom variable temperature stage (VTS) as a cryogenic thermal-transfer element. The TVS is alternately heated by a four-wire DC heater and by microwave power dissipated in a 20 dB pass-through attenuator. By fitting the thermal transients and comparing the corresponding steady-state temperatures, the absorbed microwave power is inferred from a directly measured DC electrical power through an AC/DC substitution procedure. The finite reflection and transmission of the attenuator are then accounted for by cryogenic two-port scattering-parameter measurements based on a switch-assisted Short--Open--Load--Reciprocal calibration, so that the result is referred to the DUT reference plane. The system is demonstrated in a dilution refrigerator with powers between -43 and -58 dBm at the DUT input plane. The demonstrated relative standard uncertainty ranges from about 2% at -43.9 dBm to about 40% at -57.6 dBm. The proposed approach combines thermal RF power transfer, cryogenic S-parameter correction, and uncertainty evaluation in a measurement architecture compatible with quantum-device experiments, providing a practical route toward traceable microwave-power calibration at millikelvin stages.