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AIP Advances

A single electron transistor charge sensor in strong rf fields

Rupert Lewis, Charles Thomas Harris, Eric A. Shaner

Published Oct 1, 2018• 2 citations
Publisher

Abstract

We measure the charge sensitivity, Se, of a single electron transistor (SET) in the presence of strong (Vrf ∼ e/Cg) spurious radio frequency (rf) signals at frequencies up to 50 MHz, where Cg is the gate capacitance. Although Se appears to degrade when exposed to Vrf, we find that broadening of conduction peaks is largely due to the measurement technique and show that Se is maintained even with strong Vrf present. We show cancellation of a known Vrf signal at 1 MHz, demonstrating that a stable bias point in the presence of rf signals is possible.

DOI
10.1063/1.5043212

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We measure the charge sensitivity, Se, of a single electron transistor (SET) in the presence of strong (Vrf ∼ e/Cg) spurious radio frequency (rf) signals at frequencies up to 50 MHz, where Cg is the gate capacitance. Although Se appears to degrade when exposed to Vrf, we find that broadening of conduction peaks is largely due to the measurement technique and show that Se is maintained even with strong Vrf present. We show cancellation of a known Vrf signal at 1 MHz, demonstrating that a stable bias point in the presence of rf signals is possible.
We present results on a double-island single-electron transistor (DISET) operated at radio frequency (rf) for the fast and highly sensitive detection of charge motion in the solid state. Using an intuitive definition for the charge sensitivity, we compare a DISET to a conventional single-electron transistor (SET). We find that a DISET can be more sensitive than a SET for identical, minimum device resistances in the Coulomb blockade regime. This is of particular importance for rf operation, where ideal impedance matching to 50-Ω transmission lines is only possible for a limited range of device resistances. We report a charge sensitivity of 5.6×10−6e∕Hz for a rf-DISET, together with a demonstration of the single-shot detection of small (⩽0.1e) charge signals on microsecond time scales.
The radio-frequency single-electron transistor (rf-SET) possesses key requirements necessary for reading out a solid state quantum computer. This work explores the use of the rf-SET as a single-shot readout device in the presence of 1∕f and telegraph charge noise. For a typical spectrum of 1∕f noise we find that high fidelity, single-shot measurements are possible for signals Δq>0.01e. For the case of telegraph noise, we present a cross-correlation measurement technique that uses two rf-SETs to suppress the effect of random switching events on readout. We demonstrate this technique by monitoring the charge state of a metal double dot system on microsecond time scales. Such a scheme will be advantageous in achieving high readout fidelity in a solid-state quantum computer.
We study the radio-frequency single-electron transistor (rf-SET) as a readout device for charge qubits. We measure the charge sensitivity of an rf-SET to be 6.3microe/sqrt[Hz] and evaluate the backaction of the rf-SET on a single Cooper-pair box. This allows us to compare the needed measurement time with the mixing time of the qubit imposed by the measurement. We find that the mixing time can be substantially longer than the measurement time, which would allow readout of the state of the qubit in a single shot measurement.
By operating the radio frequency single electron transistor (rf-SET) as a mixer we present measurements in which the RC roll-off of the tunnel junctions is observed at high frequencies. Our technique makes use of the nonlinear rf-SET transconductance to mix high frequency gate signals and produce difference-frequency components that fall within the bandwidth of the rf-SET. At gate frequencies >15GHz the induced charge on the rf-SET island is altered on time scales faster than the inverse tunnel rate, preventing mixer operation. We suggest the possibility of utilizing this technique to sense high frequency signals beyond the usual rf-SET bandwidth.
Telegraph noise, which originates from the switching of charge between metastable trapping sites, becomes increasingly important as device sizes approach the nanoscale. For charge-based quantum computing, this noise may lead to decoherence and loss of readout fidelity. Here we use a radio frequency single electron transistor (rf-SET) to probe the telegraph noise present in a typical semiconductor-based quantum computer architecture. We frequently observe microsecond telegraph noise, which is a strong function of the local electrostatic potential defined by surface gate biases. We present a method for studying telegraph noise using the rf-SET and show results for a charge trap in which the capture and emission of a single electron is controlled by the bias applied to a surface gate.
We have studied resonant tunneling transistors (RTT) made of single-walled carbon nanotube quantum dots in the Fabry–Pérot regime. We show sensitivity to input charge as high as 5×10−6 e/Hz1/2 with a carrier frequency of 719 MHz at 4.2 K. This result is comparable to the best values of charge sensitivity so far reported for radio frequency single electron transistors (rf-SET). Unlike SETs, whose operating temperature is limited as Coulomb blockade vanishes as 1/T, a RTT can operate at higher temperatures, since the dephasing length lϕ∝1/T2/3.