arXiv:cond-mat/0304384 · Applied Physics Letters
Single-shot readout with the radio-frequency single-electron transistor in the presence of charge noise
Tilo M. Buehler, D. J. Reilly, R.P. Starrett, Andrew D. Greentree, A. R. Hamilton, Andrew S. Dzurak, R. G. Clark
Abstract
The radio-frequency single-electron transistor (rf-SET) possesses key requirements necessary for reading out a solid state quantum computer. This work explores the use of the rf-SET as a single-shot readout device in the presence of 1∕f and telegraph charge noise. For a typical spectrum of 1∕f noise we find that high fidelity, single-shot measurements are possible for signals Δq>0.01e. For the case of telegraph noise, we present a cross-correlation measurement technique that uses two rf-SETs to suppress the effect of random switching events on readout. We demonstrate this technique by monitoring the charge state of a metal double dot system on microsecond time scales. Such a scheme will be advantageous in achieving high readout fidelity in a solid-state quantum computer.