International Conference on Solid State Devices and Materials (SSDM)
Single photon generation from an impurity center with well-defined emission energy in GaAs
L. Zhang, Michio Ikezawa, Tatsuya Mori, S. Umehara, Yoshiki Sakuma, Kazuaki Sakoda, Yasuaki Masumoto
Abstract
We studied optical properties of isoelectronic traps in nitrogen δ-doped GaAs by micro-photoluminescence (µ-PL) spectroscopy. We found that these nitrogen impurity centers (NNA) emit photons with nearly identical emission energy at 1475 meV and polarization direction. Furthermore, single photon generation from a single impurity center was confirmed by a strong photon antibunching under the continuous optical excitation at 5 K. Our results suggest that the nitrogen impurity center in GaAs might be well suited for the energetically-defined single photon source for the quantum information application.