IEEE Journal of Solid-State Circuits
Experimental single flux quantum NDRO Josephson memory cell
W.H. Henkels, J. H. Greiner
Abstract
Single flux quantum nondestructive readout (NDRO) Josephson memory cells which store an energy of only ~6/spl times/10/SUP -20/ J have been successfully fabricated and operated for the first time. Margin enhancement due to quantization, and low operating currents render this cell an attractive basis for a <1 ns access-time Josephson cache memory designed with a 2.5 /spl mu/m technology.