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IEEE Transactions on Magnetics

High density NDRO SFQ Joshepson interferometer momory cell

H. Beha

Published Nov 1, 1981• 2 citations
Publisher

Abstract

A new Single Flux-Quantum (SFQ) Nondestructive Read-Out (NDRO) random-access asymmetric 2-Josephson-junction interferometer memory cell with only one control line has been investigated and designed. The binary information is stored in the cell nonvolatilely without a bias current. For random access, this is the first known interferometer memory cell without a diagonal line. Therefore, this NDRO SFQ memory cell leads intrinsically to smaller cell area and simpler decoder schemes. A cell design of only 52 lithographic squares is given to demonstrate the potential for high-density memory chips. Wide nominal read and write operating margins are obtained. The NDRO interferometer memory cell proposed is promising for use in a high-performance Josephson computer.

DOI
10.1109/tmag.1981.1061585

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A new Single Flux-Quantum (SFQ) Nondestructive Read-Out (NDRO) random-access asymmetric 2-Josephson-junction interferometer memory cell with only one control line has been investigated and designed. The binary information is stored in the cell nonvolatilely without a bias current. For random access, this is the first known interferometer memory cell without a diagonal line. Therefore, this NDRO SFQ memory cell leads intrinsically to smaller cell area and simpler decoder schemes. A cell design of only 52 lithographic squares is given to demonstrate the potential for high-density memory chips. Wide nominal read and write operating margins are obtained. The NDRO interferometer memory cell proposed is promising for use in a high-performance Josephson computer.
An improved single flux-quantum Josephson interferometer memory cell which brought stable nondestructive read-out (NDRO) operation was proposed. The cell was constructed with an end-fed asymmetric two-junction interferometer, in which the bit operating current level could be set far above the critical point for stable NDRO operation. Damping condition for proper memory operation was studied by computer simulation. The NDRO operation was experimentally obtained for the McCumber damping parameter βc of 300–400.
A new vortex transitional NDRO memory cell has been proposed for use as a high-speed cache memory. The memory cell consists of two superconducting loops with one Josephson junction and a two-junction interferometer gate. The superconducting loop stores single-flux quantum. The interferometer gate operates as a sense gate. The memory cell employs a vortex transition in the superconducting loop for the writing and reading of data. The sense gate current margin increases to ±38% since the coupling magnetic flux is amplified by the vortex transition for nominally designed cell parameters. The memory cell operates with a ±33% address signal current margin. This paper describes the memory cell design and the dynamic behavior of computer simulations.
Fundamental design criteria for Josephson nondestructive readout random access memory (NDRO RAM) cells are presented, within the context of an LSI array environment. Emphasis is placed upon principles which are relevant to high performance. The criteria are elucidated via a specific design which is simulated and then experimentally evaluated in a technology with a smallest critical dimension of 5 μm. The specific cell differs from previously tested Josephson NDRO cells in several respects; namely, the cell stores only ∼8Φ0, employs interferometer gates and an external damping resistor, allows switching into device resonances, and eliminates the need for a special initialization cycle. The cell-selection scheme, employing triple coincidence, results in larger operating margins and smaller operating currents than have previously been achieved. The large operating margins and all basic cell design criteria were experimentally verified. The experimental interferometer gate characteristics were analyzed in detail and found to be describable by simple models. In addition, it was discovered that single flux quantum transitions in the interferometer gates could be exploited beneficially in order to enhance the insensitivity of operating margins to fabrication tolerances.