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Applied Physics Letters

Minimization of noise-induced bit error rate in a high Tc superconducting dc/single flux quantum converter

Thomas Ortlepp, Hannes Toepfer, Hermann F. Uhlmann

Published Feb 26, 2001• 11 citations
Publisher

Abstract

The thermally induced bit error rate of a rapid single flux quantum logic circuit is theoretically examined using the Fokker–Planck equation. The error rate versus design parameters of a high Tc dc/single flux quantum converter is derived. In comparison with other design methodologies, a vanishingly small error rate at optimal parameters can be achieved.

DOI
10.1063/1.1341228

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The thermally induced bit error rate of a rapid single flux quantum logic circuit is theoretically examined using the Fokker–Planck equation. The error rate versus design parameters of a high Tc dc/single flux quantum converter is derived. In comparison with other design methodologies, a vanishingly small error rate at optimal parameters can be achieved.
A major restriction in the development of a working Rapid Single Flux Quantum (RSFQ) logic circuit with high-Tc superconductors is given by the influence of thermal noise. This gives reason to ask for a general determination of the digital bit error rate. As other approaches, our method of calculating the switching probability is based on the Fokker-Planck equation. In the past few years the bit error rates for a single Josephson junction, SQUIDs and the comparator were calculated by using this theory. We demonstrate numerical solution of the multidimensional Fokker-Planck equation to calculate bit error rates due to thermal noise for a Toggle Flip Flop circuit. In the present work, we combine thermal noise analysis with the effects of process variations in order to derive rules for designing high-Tc RSFQ logic circuits.
The influence of thermal noise gives a major restriction in the development of Rapid Single Flux Quantum (RSFQ) logic circuits with high-T/sub c/ superconductors. In the past, we have demonstrated a general way for determining the digital bit error rate and for predicting operation ranges with good noise immunity. The method is based on a single Fokker-Planck equation which includes the full system dynamics. However, the complexity of this equation increases dramatically with the number of Josephson junctions. Our new approach describes a method to divide an RSFQ logic cell into several basic primitives. They can be characterized quickly in terms of switching probability for a lot of different parameters. From these analyses, look-up tables are built-up. We describe how to combine these data in order to achieve the bit-error rate for the whole cell. While saving more than 90% of computation time, the comparison with our previous results for full system analyses shows less than 4% difference. This approach provides for a powerful tool to include the influence of thermal noise into the optimization process of RSFQ logic circuits as well.
All complex devices in rapid single flux quantum (RSFQ) technique work at much lower clock rates than possible for simple cells. New data driven self timed or asynchronous concepts can reduce this gap, but even in this case still a discrepancy between simulation and experiment is shown. It has been pointed out in previous studies, that the influence of thermal fluctuations in RSFQ circuits is divided into static and dynamic switching bit errors as well as timing jitter induced failures. The bit error rate depends exponentially on the temperature and is not the main issue in the low temperature technique. Our last results show for the first time, that the variance of the switching time is much slower decreased by reducing the temperature and is still important at 4.2 K. We describe a general method for calculating the switching time distribution for RSFQ cells. Furthermore, we present detailed results for a timing analysis of a dc/SFQ-converter. The delay between output signal and the input current ramp shows a variation over 1 ps which is more than 10% of the switching time itself. This new understanding of the background of timing jitter enables a goal-oriented improvement in the design process of RSFQ circuits.
The discovery of the superconductive properties of magnesium diboride enables us to attempt to produce a rapid single flux quantum (RSFQ) logic device with an operation temperature of about 20 K which can be easily reached with cryocoolers. As elevated temperatures significantly increase the probability of noise-induced errors, we examine the situation in this particular temperature range. We calculate bit-error rates (BER) due to thermal noise for a toggle flip-flop as a typical RSFQ circuit with a clock frequency of 100 GHz. For this, we consider parameter spread and noise separately and observe a very low noise-induced BER. The critical margin diminishes by a small amount only.
The application of high temperature superconductor (HTS) Josephson junctions in digital rapid single flux quantum circuits requires a careful study of the influence of thermal noise on the bit error rate (BER). We have determined experimentally, for the first time, the BER of a HTS rapid single flux quantum circuit. A comparator, formed by two Josephson junctions, was integrated in a Josephson transmission line ring oscillator, allowing us to perform high speed testing of the comparator at GHz frequencies. For fabrication, focused-electron-beam-irradiated junctions have been used because of their small parameter spread and excellent alignment possibilities. A BER of less than 10−11 was obtained at 39 K.