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Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

Nonlinear index of refraction and photon echo formation in superthin doped film

Irina V. Gadomskaya, Sergey G. Moiseev

Published Sep 26, 1997• 0 citations
Publisher

Abstract

A method of integrodifferential equations associated with the optical Bloch equations is used to consider the boundary-value problem of nonlinear reflection (refraction) of the laser beams on the superthin film doped by the two-level atoms. An allowance is made for the phase memory effects exhibited by two-level atoms in response to pulses of fields resolved in space and time. A generalized Lorentz-Lorenz formula is derived for a nonlinear complex refractive index of an doped film in the region of an absorption band when this index depends nonlinearly and nonstationarly on the field inside the film. We derived generalized synchronism conditions to investigate the angular distribution of reflected and refracted primary photon echo signals.

DOI
10.1117/12.287664

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A method of integrodifferential equations associated with the optical Bloch equations is used to consider the boundary-value problem of nonlinear reflection (refraction) of the laser beams on the superthin film doped by the two-level atoms. An allowance is made for the phase memory effects exhibited by two-level atoms in response to pulses of fields resolved in space and time. A generalized Lorentz-Lorenz formula is derived for a nonlinear complex refractive index of an doped film in the region of an absorption band when this index depends nonlinearly and nonstationarly on the field inside the film. We derived generalized synchronism conditions to investigate the angular distribution of reflected and refracted primary photon echo signals.
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The role of near field effect is investigated in the boundary value problem of nonlinear resonant optics at the interaction of steady quasiresonant optical radiation with the film of two-level atoms. Dynamical detuning from resonance, nonlinear index of refraction, reflected and refracted waves are analyzed on the basis of solution of closed system of integral field equation and optical Bloch equations with account for discrete-continuous distribution of two-level atoms. An essential dependence of near field effect upon type of symmetry of atomic distribution is shown.
In nonlinear resonance optics, the boundary-value problem of the interaction of steady quasiresonant optical radiation with an ultrathin film is solved within the framework of a model of a discretely continuous film of atoms in which the point of observation is surrounded by discretely distributed atoms forming a truncated Lorentz sphere. Outside the sphere the distribution of atoms is continuous. A closed system, formed by an integral field equation and modified Bloch equations, is used to calculate the microscopic field inside the film and thus the dynamic detuning from a resonance, which takes account of the near-field effect, i.e. of the discretely continuous distribution of atoms in the film. A significant dependence of the effect on the nature of the symmetry of the distribution of atoms in the film is demonstrated.
Understanding the processes underlying the optical excitation of atomic vapor in the vicinity of solid surfaces is of interest both from physical and technical points of view. Selective reflection spectra of laser light from an interface of a transparent dielectric material and resonant vapor are known to be Doppler-free and to provide important spectroscopic information about the atom-wall interaction. On the other hand, atomic vapors have such a large and fast nonlinear response on or near resonances that they are capable of processing signals and images with milliwatt lasers at a time scale of submicroseconds. In the present paper we investigate linear and nonlinear optical properties of a thin film of atomic vapor confined between two solid surfaces. Assuming two-level atoms, we solve the Maxwell- Bloch equations for light reflection from resonant atoms. The interaction between the resonant atoms and the wall is accounted for through the boundary conditions for all elements of density matrix. The transient polarization is shown to make an important contribution not only to the field structure in the vicinity of the wall but also to the interference pattern of the reflected field. It is found that the spectrum of reflection depends remarkably on the film thickness. Strong enhancement of signal is also found from this study and possible devices for the detection are discussed.
We study the self-action of an amplitude-modulated beam in a two-level saturable absorbing medium. We also consider the radial quadratic dependence of the linear refraction index to apply the results to doped waveguides. As the modulation period approaches the relaxation times, the medium response is no more instantaneous, so that one should solve the full set of Maxwell-Bloch equations. We propose a second-order scheme with the Gauss-Laguerre transformation of the transverse field pattern. A simplified approach based on the synchronous interaction approximation is used for thin layers. We analyze the transient behavior of the medium response and its manifestation in the modulation of the beam diffracting after a thin saturable absorber. Nonlinear distortions of the modulation signal passed through a doped waveguide appear to be unexpectedly small compared with those of the local polarization and population difference.