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Applied Physics Letters

Origin of 1/f noise in Y1Ba2Cu3O7−x step-edge dc SQUIDs

Dirk Grundler, Rainer Eckart, Bernd R. David, Olaf Dössel

Published Apr 26, 1993• 24 citations
Publisher

Abstract

We have fabricated Y1Ba2Cu3O7−x step-edge junction dc superconducting quantum interference devices (SQUIDs) and characterized their noise performance. The current-voltage characteristics of our SQUIDs are of resistively shunted junction type with critical current densities jc of about 104 A/cm2 and maximum flux to voltage transfer functions δV/δΦ of 20 μV/Φ0 at 77 K. We compare model predictions for 1/f noise in dc SQUIDs with experimental data and show that the frequency dependent noise in our devices results from critical current fluctuations of the Josephson junctions. A bias current reversing technique is effective in suppressing this noise contribution. A flux noise Φn of 80 μΦ0/Hz1/2 at 1 Hz and 77 K was measured on a dc SQUID with an inductance Ls of 60 pH.

DOI
10.1063/1.109450

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We have fabricated Y1Ba2Cu3O7−x step-edge junction dc superconducting quantum interference devices (SQUIDs) and characterized their noise performance. The current-voltage characteristics of our SQUIDs are of resistively shunted junction type with critical current densities jc of about 104 A/cm2 and maximum flux to voltage transfer functions δV/δΦ of 20 μV/Φ0 at 77 K. We compare model predictions for 1/f noise in dc SQUIDs with experimental data and show that the frequency dependent noise in our devices results from critical current fluctuations of the Josephson junctions. A bias current reversing technique is effective in suppressing this noise contribution. A flux noise Φn of 80 μΦ0/Hz1/2 at 1 Hz and 77 K was measured on a dc SQUID with an inductance Ls of 60 pH.
Autonomous single-layer dc superconducting quantum interference devices (SQUIDs) have been prepared from epitaxial, laser-deposited YBa2Cu3Ox films on step edge SrTiO3 and LaAlO3 substrates. For device patterning, a SiOx inhibit technique as well as conventional ethylenediaminetetraacetic wet etch was used. The Josephson junctions are of grain boundary type. Their widths are 5 μm. The SQUID hole is a square of about 5 μm; the SQUID inductance is estimated to be about 20 pH. We obtained a very regular, nonhysteretic flux to voltage modulation over more than 100 flux quanta (Φ0). The maximum voltage signal is of the order of 15 μV peak to peak and the maximum transfer function dV/dΦ at the appropriate flux bias is 50 μV/Φ0 at 77 K. The best value of the equivalent flux noise as measured in the flux locked loop mode is 1.4×10−5 Φ0/Hz1/2 at 1 Hz and 1×10−5 Φ0/Hz1/2 in the white noise region for f≳5 Hz. This results in an energy resolution εn,w(f≳5 Hz)=1×10−29 J/Hz in the white noise region and 2×10−29 J/Hz at 1 Hz.
We report the development of a fabrication process of high-resistance step-edge Josephson junctions on sharp argon ion beam etched substrate steps. For a reproducible fabrication, the redeposition of material at the step during the etch process has to be avoided. This is achieved by an alternating angle of ion incidence parallel to the edge of the photoresist mask. The reproducible straight step profile exhibits an angle around and is reflected in reproducible electrical properties of the junctions. Critical current and asymptotic normal state resistance both scale with the junction width w . The current-voltage ( I - V ) characteristics depend on the ratio of film thickness t to step height h . For > 0.85 they are flux-flow-like; for < 0.8 they correspond to the resistively shunted junction (RSJ) model. Lower ratios of correspond to higher specific resistances resulting at 77 K typically in asymptotic normal state resistances between 5 and per junction, depending on w . At 77 K we achieve products of more than . The junctions are applied to dc superconducting quantum interference devices (dc-SQUIDs) with inductances between 25 and 35 pH. At 77 K transfer functions of more than are achieved. noise of the step-edge dc-SQUIDs is observed, but using bias current modulation it is entirely suppressed resulting in a spectral density of flux noise of measured at 1 Hz and 77 K for a SQUID with an inductance of 30 pH.
A low-noise coupled DC superconducting quantum interference device (SQUID) especially optimized for low frequency is discussed. Using large Josephson junctions and a low loop inductance the contribution of the critical current fluctuation to 1/f noise can be minimized. To minimize the inductance the Josephson junctions are placed in the center of the washer close to the SQUID loop. A scaled-up copper model of the SQUID and the signal coil is used to analyze the impedance of the SQUID loop affected by the signal coil. An equivalent circuit model describing the effective inductance of the SQUID loop as a function of the frequency is used to design appropriate damping of the resonances. The DC SQUID characteristics are smooth and the noise performance of the SQUID does not markedly suffer from resonances. The contribution of the 1/f noise at 1 Hz is found to be about 5*10/sup -7/ Phi /sub 0// square root Hz.>
We have fabricated and characterized the noise performance of well-coupled Nb-Pb alloy edge junction dc superconducting quantum interference devices (SQUIDs) with a resistively shunted inductance. The extra damping resistor removes the resonances in the current-voltage characteristics resulting in a very low value of the extrinsic energy sensitivity in flux-locked-loop operation. Numerical simulations, with the junction capacitance included, indicate that the damping resistance does not degrade noise performance until it is significantly less than the junction-shunting resistance. We also tested different SQUID designs and demonstrated that a large SQUID inductance, proposed earlier to be desirable when resistively shunted, can seriously affect the low-frequency flux noise.
We demonstrate that the low-frequency noise in our edge junction dc superconducting quantum interference devices, with a basic 1/f flux noise of 2×10−12 Φ20/Hz at 1 Hz, can all be accounted for in terms of junction critical current fluctuations. A novel modulation readout scheme is able to cancel the effect of junction critical current fluctuations and reduce our total noise to 1×10−12 Φ20/Hz at 0.1 Hz, a level that is three times lower than the lowest flux noise ever previously reported at this frequency.
The design, fabrication, and noise properties of an ultra-low-noise tunnel junction dc SQUID (superconducting quantum interference device) are presented. The two resistively shunted Pb-alloy tunnel junctions are each 3.6 μm diam. The SQUID has an inductance L of ≈11 pH, a critical current per junction, I0 of ≈100 μA, and a resistance per shunt R of ≈2 Ω. At 2.3 K, eI0R≈kBT, and simple theory predicts that the minimum intrinsic energy sensitivity should be ≈2h. The actual minimum value of the measured high-frequency (70 kHz) flux noise at 4.2 K is φn=1.3×10−7φ0 Hz−1/2. This corresponds to an intrinsic energy sensitivity, φ2n/2L, of 3.2×10−33 J Hz−1 or 5h. Lowering the bath temperature to 1.8 K gave no improvement in performance.