Journal of Applied Physics

Microwave field distribution in superconducting thin film devices

D. Quenter, T. Doderer, Rudolf Peter Huebener

Published Sep 15, 1996• 2 citations

Abstract

We measured the spatial distribution of microwave fields and dissipative surface currents in various passive and active superconducting thin-film devices during their operation at a temperature of about 4 K. We used low-temperature scanning electron microscopy which offers a spatial resolution of about 1 μm and we present sample response models for interpreting the imaging results. Such investigations may have important consequences for the improvement of the design and preparation of superconducting thin-film microwave devices.

DOI: 10.1063/1.363230

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