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IEEE Transactions on Applied Superconductivity

Imaging sub-millimeter waves in planar cryoelectronic circuits by scanning laser microscopy

Dmytro V Abraimov, Alexey Vladimirovich Ustinov, S. V. Shitov

Published Mar 1, 2001• 4 citations
Publisher

Abstract

Low temperature scanning laser microscopy (LTSLM) is demonstrated to be capable of imaging sub-THz electromagnetic fields in cryoelectronic integrated structures. This method allows one to evaluate the spatial distribution of time-averaged field amplitudes with a resolution of about one micrometer for samples with characteristic dimensions of order millimeters. Using LTSLM, cryoelectronic devices with both passive and active superconducting elements can be characterized. Local heating of superconducting structures by a laser beam introduces extra loss for the propagating and standing sub-millimeter waves. We present LTSLM images of two-dimensional 400 to 500 standing GHz wave patterns in integrated superconducting receiver chips.

DOI
10.1109/77.919445

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Low temperature scanning laser microscopy (LTSLM) is demonstrated to be capable of imaging sub-THz electromagnetic fields in cryoelectronic integrated structures. This method allows one to evaluate the spatial distribution of time-averaged field amplitudes with a resolution of about one micrometer for samples with characteristic dimensions of order millimeters. Using LTSLM, cryoelectronic devices with both passive and active superconducting elements can be characterized. Local heating of superconducting structures by a laser beam introduces extra loss for the propagating and standing sub-millimeter waves. We present LTSLM images of two-dimensional 400 to 500 standing GHz wave patterns in integrated superconducting receiver chips.
Low temperature scanning electron microscopy (LTSEM) offers the possibility for spatially resolved investigations of microwave properties of single Josephson junctions, superconducting striplines, resonators, and complex cryoelectric circuits during their operation. The spatial resolution of about 1 μm is at least two orders of magnitude better than the typical wavelength (≳100 μm in the elements) in the frequency range of interest (50–500 GHz). We demonstrate that LTSEM is a well suited tool for the experimental investigation of superconducting microwave devices and cryoelectronic circuits.
We use low temperature scanning laser microscope (LTSLM) to study the Joule power distribution of superconducting (SC) terahertz (THz) modulator. The LTSLM scanning images record the SC state transformation process under different DC bias voltages. The change of THz transmission spectra can be well explained by the thermal effect in the devices observed by LTSLM. Hotspots are present in one THz modulator and the transmission spectra changes a lot after the hotspots show up. According to theoretical analysis, the appearance of hotspot may be helpful for improving the modulation speed. These results will be useful to understand the mechanism of SC THz modulator and design higher performance THz moduators.
Superconducting microcircuits and metamaterials are promising candidates for use in new generation cryogenic electronics. Their functionality is largely justified by the macroscopic distribution of electromagnetic fields in arranged unit cells, rather than by the microscopic properties of composite materials. We present a new method for visualizing the spatial structure of penetrating microwaves with microscopic resolution in planar superconducting macroscopic resonators as the most important circuit-forming elements of modern microelectronics. This method uses a low-temperature laser scanning microscope that examines the phase (i.e., direction) and amplitude of local radio-frequency currents versus the two-dimensional coordinates of the superconducting resonant structure under test. Phase-sensitive contrast is achieved by synchronizing the intensity-modulated laser radiation with the resonant harmonics of the microwave signal passing through the sample. In this case, the laser-beam-induced loss in the illuminated area will strongly depend on the local phase difference between the RF carrier signal and the spatially temporal structure of the focused laser oscillation. This approach eliminates the hardware limitations of the existing technique of radio-frequency microscopy and brings the phase-sensitive demodulation mode to the level necessary for studying the physics of superconducting metamaterials. The advantage of the presented method over the previous method of RF laser scanning micros-copy is demonstrated by the example of the formation of standing waves in a spiral superconducting Archimedean resonator up to the 38th eigenmode resonance.
We propose an improved measuring technique for microwave currents in superconductive circuits, demonstrate it experimentally, and validate the experimental data with numerical simulations. Contemporary superconductive electronics widely uses planar circuits with micrometer-scale elements for a variety of applications. With the rise of complexity of a circuit and increase in the number of its components, a simple impedance measurement is often not efficient for the diagnosis of problems, nor for clarifying the physics underlying the circuit response. The established Laser Scanning Microscopy (LSM) technique generates micrometer-scale images of the amplitude of the microwave currents in a planar superconductive circuit, but not the phase of the oscillating currents. Here, we present a more powerful type of LSM imaging containing signal phase information. We employ a fast-optical modulator in order to synchronize the phase of the laser intensity oscillation with the phase of the probing microwave signal. The loss induced in a laser illuminated area strongly depends on the phase difference between the RF probing signal and the laser beam modulation. As a proof of concept, we present the phase-sensitive LSM measurements of the inner mode currents in a planar superconductive resonator and confirm the data with numerical simulation of the resonator's electrodynamics.
This work presents new experimental results on low-temperature (LT) characterization of local RF properties of passive superconducting (SC) microwave devices using a novel laser scanning microscope (LSM). In this technique, a modulated laser beam is focused onto and scanned over the surface of a resonant SC device to probe the spatial distribution of RF current. The highly localized photo-induced change of the kinetic inductance of the SC device produces both a shift of the resonant frequency f/sub 0/ and change of the quality factor Q. An image of these changes is recorded as the laser spot is scanned over the device. We present the first measurements of spatially resolved intermodulation response in a high temperature superconducting (HTS) co-planar waveguide resonator, opening up a new window into the local origins of nonlinearity in the HTS materials.
We measured the spatial distribution of microwave fields and dissipative surface currents in various passive and active superconducting thin-film devices during their operation at a temperature of about 4 K. We used low-temperature scanning electron microscopy which offers a spatial resolution of about 1 μm and we present sample response models for interpreting the imaging results. Such investigations may have important consequences for the improvement of the design and preparation of superconducting thin-film microwave devices.