Challenges
Datasets
Workspaces
Papers
Discussions
Leaderboard
Log inSign up
Challenges
Datasets
Workspaces
Papers
Discussions
Leaderboard
Blog
Job Board
Q3AS

© 2026 Aqora Quantum S.A.S.

TermsPrivacyLegal Notice

Applied Physics Letters

Spatially resolved studies of the microwave properties of superconducting devices

D. Quenter, S. Stehle, T. Doderer, C. A. Kruelle, Rudolf Peter Huebener, F. Müller, J. Niemeyer, R. Pöpel, Thomas Weimann, Rich Ruby, Andrew T. Barfknecht

Published Oct 11, 1993• 11 citations
Publisher

Abstract

Low temperature scanning electron microscopy (LTSEM) offers the possibility for spatially resolved investigations of microwave properties of single Josephson junctions, superconducting striplines, resonators, and complex cryoelectric circuits during their operation. The spatial resolution of about 1 μm is at least two orders of magnitude better than the typical wavelength (≳100 μm in the elements) in the frequency range of interest (50–500 GHz). We demonstrate that LTSEM is a well suited tool for the experimental investigation of superconducting microwave devices and cryoelectronic circuits.

DOI
10.1063/1.110564

Related papers

Microwave field distribution in superconducting thin film devices

D. Quenter, T. Doderer, Rudolf Peter Huebener

We measured the spatial distribution of microwave fields and dissipative surface currents in various passive and active superconducting thin-film devices during their operation at a temperature of about 4 K. We used low-temperature scanning electron microscopy which offers a spatial resolution of about 1 μm and we present sample response models for interpreting the imaging results. Such investigations may have important consequences for the improvement of the design and preparation of superconducting thin-film microwave devices.

Journal of Applied Physics•Sep 15, 1996•2 citations

Imaging sub-millimeter waves in planar cryoelectronic circuits by scanning laser microscopy

Dmytro V Abraimov, Alexey Vladimirovich Ustinov, S. V. Shitov

Low temperature scanning laser microscopy (LTSLM) is demonstrated to be capable of imaging sub-THz electromagnetic fields in cryoelectronic integrated structures. This method allows one to evaluate the spatial distribution of time-averaged field amplitudes with a resolution of about one micrometer for samples with characteristic dimensions of order millimeters. Using LTSLM, cryoelectronic devices with both passive and active superconducting elements can be characterized. Local heating of superconducting structures by a laser beam introduces extra loss for the propagating and standing sub-millimeter waves. We present LTSLM images of two-dimensional 400 to 500 standing GHz wave patterns in integrated superconducting receiver chips.

IEEE Transactions on Applied Superconductivity•Mar 1, 2001•4 citations

Quantitative measurement of the microwave distribution in superconducting tunnel junctions

Richard A. Gerber, D. Quenter, T. Doderer +6 more

Low temperature scanning electron microscopy offers the possibility to measure the microwave distribution inside Josephson tunnel junctions in a quantitative way. The junctions are coupled to an external microwave source. Our results confirm the established model for the propagation of microwaves inside the junction stripline. Our method yields microwave specific parameters of the junction such as wavelength, microwave attenuation, reflection coefficients, and phase shifts.

Applied Physics Letters•Mar 20, 1995•6 citations

A novel cryogenic scanning laser microscope tested on Josephson tunnel junctions

Jason D. Holm, J. Mygind

A novel cryogenic scanning laser microscope with a spatial resolution of less than 5 μm has been designed for on-chip in situ investigations of the working properties of normal and superconducting circuits and devices. The instrument relies on the detection of the electrical response of the circuit to a very localized heating induced by irradiation with 675 nm wavelength light from a semiconductor laser. The hot spot is moved by a specially designed piezoelectric scanner sweeping the tip of a single-mode optical fiber a few μm above the circuit. Depending on the scanner design the scanning area can be as large as 50×500 μm2 at 4.2 K. The microscope can be operated in the temperature range 2–300 K using a standard temperature controller. The central microscope body is mounted inside the vacuum can of a dip-stick-type cryoprobe. A damped spring system is used to reduce interference from extraneous mechanical vibrations. The microscope is integrated in a personal-computer-based data acquisition and control setup.

Review of Scientific Instruments•Sep 1, 1995•4 citations

A cryogenic scanning laser microscope for investigation of dynamical states in long Josephson junctions

J. Helm, J. Mygind

The first local oscillators based on moving magnetic flux quanta in long Josephson junctions are being developed for superconducting integrated quasi-optical SIS receivers. In order to further refine these oscillators one has to understand the complex dynamics of these devices. Since the local tunnel current is one of the most important internal junction parameters which together with the boundary conditions determine the dynamics, it is of vital importance to experimentally determine the current density throughout the entire junction with high spatial resolution. Here we report on measurements on different oscillator samples, performed with a novel Cryogenic Scanning Laser Microscope (CSLM) having a spatial resolution of less than /spl plusmn/2.5 /spl mu/m over a 500 /spl mu/m/spl times/50 /spl mu/m wide scanning area in the temperature range 2 K-300 K. Even though the dynamical states are extremely sensitive to external noise this microscope enables us to make stable in-situ measurements on operating Josephson junctions. Recent results are presented and discussed.>

IEEE Transactions on Applied Superconductivity•Jun 1, 1995•0 citations

Phase-resolved visualization of radio-frequency standing waves in superconducting spiral resonator for metamaterial applications

A. A. Leha, Alexander P. Zhuravel, Alexandre Karpov +2 more

Superconducting microcircuits and metamaterials are promising candidates for use in new generation cryogenic electronics. Their functionality is largely justified by the macroscopic distribution of electromagnetic fields in arranged unit cells, rather than by the microscopic properties of composite materials. We present a new method for visualizing the spatial structure of penetrating microwaves with microscopic resolution in planar superconducting macroscopic resonators as the most important circuit-forming elements of modern microelectronics. This method uses a low-temperature laser scanning microscope that examines the phase (i.e., direction) and amplitude of local radio-frequency currents versus the two-dimensional coordinates of the superconducting resonant structure under test. Phase-sensitive contrast is achieved by synchronizing the intensity-modulated laser radiation with the resonant harmonics of the microwave signal passing through the sample. In this case, the laser-beam-induced loss in the illuminated area will strongly depend on the local phase difference between the RF carrier signal and the spatially temporal structure of the focused laser oscillation. This approach eliminates the hardware limitations of the existing technique of radio-frequency microscopy and brings the phase-sensitive demodulation mode to the level necessary for studying the physics of superconducting metamaterials. The advantage of the presented method over the previous method of RF laser scanning micros-copy is demonstrated by the example of the formation of standing waves in a spiral superconducting Archimedean resonator up to the 38th eigenmode resonance.

arXiv:2201.06660•Low Temperature Physics•Jan 26, 2022•2 citations
Low temperature scanning electron microscopy (LTSEM) offers the possibility for spatially resolved investigations of microwave properties of single Josephson junctions, superconducting striplines, resonators, and complex cryoelectric circuits during their operation. The spatial resolution of about 1 μm is at least two orders of magnitude better than the typical wavelength (≳100 μm in the elements) in the frequency range of interest (50–500 GHz). We demonstrate that LTSEM is a well suited tool for the experimental investigation of superconducting microwave devices and cryoelectronic circuits.
We measured the spatial distribution of microwave fields and dissipative surface currents in various passive and active superconducting thin-film devices during their operation at a temperature of about 4 K. We used low-temperature scanning electron microscopy which offers a spatial resolution of about 1 μm and we present sample response models for interpreting the imaging results. Such investigations may have important consequences for the improvement of the design and preparation of superconducting thin-film microwave devices.
Low temperature scanning laser microscopy (LTSLM) is demonstrated to be capable of imaging sub-THz electromagnetic fields in cryoelectronic integrated structures. This method allows one to evaluate the spatial distribution of time-averaged field amplitudes with a resolution of about one micrometer for samples with characteristic dimensions of order millimeters. Using LTSLM, cryoelectronic devices with both passive and active superconducting elements can be characterized. Local heating of superconducting structures by a laser beam introduces extra loss for the propagating and standing sub-millimeter waves. We present LTSLM images of two-dimensional 400 to 500 standing GHz wave patterns in integrated superconducting receiver chips.
A novel cryogenic scanning laser microscope with a spatial resolution of less than 5 μm has been designed for on-chip in situ investigations of the working properties of normal and superconducting circuits and devices. The instrument relies on the detection of the electrical response of the circuit to a very localized heating induced by irradiation with 675 nm wavelength light from a semiconductor laser. The hot spot is moved by a specially designed piezoelectric scanner sweeping the tip of a single-mode optical fiber a few μm above the circuit. Depending on the scanner design the scanning area can be as large as 50×500 μm2 at 4.2 K. The microscope can be operated in the temperature range 2–300 K using a standard temperature controller. The central microscope body is mounted inside the vacuum can of a dip-stick-type cryoprobe. A damped spring system is used to reduce interference from extraneous mechanical vibrations. The microscope is integrated in a personal-computer-based data acquisition and control setup.
The first local oscillators based on moving magnetic flux quanta in long Josephson junctions are being developed for superconducting integrated quasi-optical SIS receivers. In order to further refine these oscillators one has to understand the complex dynamics of these devices. Since the local tunnel current is one of the most important internal junction parameters which together with the boundary conditions determine the dynamics, it is of vital importance to experimentally determine the current density throughout the entire junction with high spatial resolution. Here we report on measurements on different oscillator samples, performed with a novel Cryogenic Scanning Laser Microscope (CSLM) having a spatial resolution of less than /spl plusmn/2.5 /spl mu/m over a 500 /spl mu/m/spl times/50 /spl mu/m wide scanning area in the temperature range 2 K-300 K. Even though the dynamical states are extremely sensitive to external noise this microscope enables us to make stable in-situ measurements on operating Josephson junctions. Recent results are presented and discussed.>
Superconducting microcircuits and metamaterials are promising candidates for use in new generation cryogenic electronics. Their functionality is largely justified by the macroscopic distribution of electromagnetic fields in arranged unit cells, rather than by the microscopic properties of composite materials. We present a new method for visualizing the spatial structure of penetrating microwaves with microscopic resolution in planar superconducting macroscopic resonators as the most important circuit-forming elements of modern microelectronics. This method uses a low-temperature laser scanning microscope that examines the phase (i.e., direction) and amplitude of local radio-frequency currents versus the two-dimensional coordinates of the superconducting resonant structure under test. Phase-sensitive contrast is achieved by synchronizing the intensity-modulated laser radiation with the resonant harmonics of the microwave signal passing through the sample. In this case, the laser-beam-induced loss in the illuminated area will strongly depend on the local phase difference between the RF carrier signal and the spatially temporal structure of the focused laser oscillation. This approach eliminates the hardware limitations of the existing technique of radio-frequency microscopy and brings the phase-sensitive demodulation mode to the level necessary for studying the physics of superconducting metamaterials. The advantage of the presented method over the previous method of RF laser scanning micros-copy is demonstrated by the example of the formation of standing waves in a spiral superconducting Archimedean resonator up to the 38th eigenmode resonance.