In this study, the trade-off among power consumptions, operating frequencies, and error rates in low-power single-flux-quantum (SFQ) circuit is investigated. The power consumption of SFQ circuits can be reduced by the lowering critical currents (
Icvalues) of the Josephson junctions (JJs), or the bias voltage (
Vb). The shifts and spreads of timing parameter fluctuations when
Icand
Vbwere lowered were numerically analyzed, with consideration of thermal noise at 4.2 K. The timing behaviors after
Icwas lowered were relatively simple, being based on the signal-to-noise ratio, whereas those for lowered
Vbvalues were complicated because of the dynamic behaviors of JJs driven at reduced voltage. The simulation results imply that the operating frequencies decreased because the timing windows narrowed, but the highest energy efficiency was obtained when we lowered
Icor
Vbto 6.25% of their conventional values, and the energy reduction after lowering of
Vbwas 26% better than that after lowering of
Ic. Moreover, if a small error rate (for example
10−6) is acceptable, further improvement in energy efficiency would be expected at significantly higher clock frequencies than would be the case if the SFQ circuit must exhibit error-free operation.
The process of reproduction of single flux quantum pulses in a Josephson junction chain composed of a pulse generator, a balanced comparator, and a single Josephson junction is investigated. It is shown that the reproduction of single flux quantum pulses in such a chain is more stable and the mean and the standard deviation of switching time are minimal for the McCumber-Stewart parameter value from 0.5 to 1 and for a normalized clock generator current around 1.5. The influence of input and output inductances on the characteristics of a balanced comparator is investigated. The recommended value of the output inductance leading to smooth pulses and relatively small jitter is around unity.
All complex devices in rapid single flux quantum (RSFQ) technique work at much lower clock rates than possible for simple cells. New data driven self timed or asynchronous concepts can reduce this gap, but even in this case still a discrepancy between simulation and experiment is shown. It has been pointed out in previous studies, that the influence of thermal fluctuations in RSFQ circuits is divided into static and dynamic switching bit errors as well as timing jitter induced failures. The bit error rate depends exponentially on the temperature and is not the main issue in the low temperature technique. Our last results show for the first time, that the variance of the switching time is much slower decreased by reducing the temperature and is still important at 4.2 K. We describe a general method for calculating the switching time distribution for RSFQ cells. Furthermore, we present detailed results for a timing analysis of a dc/SFQ-converter. The delay between output signal and the input current ramp shows a variation over 1 ps which is more than 10% of the switching time itself. This new understanding of the background of timing jitter enables a goal-oriented improvement in the design process of RSFQ circuits.
We have designed and tested a Rapid Single-Flux-Quantum (RSFQ) circuit for experimental measurement of the fluctuation-induced threshold uncertainty of switching of SFQ comparators, which are essential components of RSFQ logic devices, analog-to-digital converters, and digital SQUIDs. Statistical density of the switching events in comparators using externally-overdamped Nb-trilayer Josephson junctions has been found to be in agreement with the distribution which follows from a simple theory based on a time-dependent harmonic-oscillator model of the device. Width of the distribution (i.e, the single-shot current resolution of the comparator) measured as a function of temperature in the range 1.7-4.2 K corresponds to fundamental (thermal/quantum) fluctuations, with no evidence of excess noise sources.>
We adopt superconductor/ferromagnet/insulator/superconductor (SFIS) Josephson junctions (JJs) as both switching JJs and intrinsic π phase shifters in superconductor digital circuits. The critical current density (Jc) and characteristic voltage (Vc) of the SFIS junctions are about 22 A/cm2 and 22 μV, respectively. The intrinsic π phase shift is confirmed by measuring the suppressed nominal critical current Icn and half-period-shifted modulation pattern of a π–π–π superconducting quantum interference device (SQUID) that contains three π-JJs in a superconducting loop. A single-flux-quantum (SFQ) circuit composed of a DC/SFQ, Josephson transmission line (JTL), and SFQ/DC converter based on SFIS JJs alone is demonstrated at 4.2 K. The energy dissipation of the SFQ/DC converter decreases by 80% because some JJs are self-biased by the π phase shifter. The intrinsic circulating currents induced by the π phase shifters lead to a narrow bias margin (±5%) and even error function, which can be solved by parameters optimization or circuit initialization in the future. The half-modulation period (Φ0/2) of a half-flux-quantum (HFQ) SQUID (a partial HFQ JTL) exhibits propagation of HFQ between π–π–π SQUIDs, indicating that more complex HFQ circuits can be developed with π-JJs alone in the future.