Advanced Quantum Technologies
On‐Chip Cryogenic Level Meters for Magnetic Field Based on TiN Superconducting Microwave Resonators
Shu-Kun Ye, Zi‐Qing Huang, Yong-Qiang Xu, Yuan Kang, Rui Wu, Song-Yan Deng, Bao‐Chuan Wang, Ran-Ran 冉冉 Cai 蔡, Hai‐Ou Li, Xiang‐Xiang Song, Gang Cao, Guo‐Ping Guo
Abstract
ABSTRACT Precise control of the external magnetic field orientation with respect to quantum devices is of particular importance since the field orientation can significantly influence quantum states. Therefore, in situ calibration of rotational misalignment of the magnetic field at cryogenic temperatures, where quantum devices are usually operated, is essential, yet remains largely unexplored. Here, leveraging the advantages of low microwave loss and high critical field, we demonstrate that high‐quality TiN nanowire superconducting microwave resonators exhibit sensitive and anisotropic responses to varied magnetic fields, enabling three‐dimensional calibration of the field orientation using a single device. Based on a developed tensor model, we extract competitive out‐of‐plane orientation calibration uncertainty of . Our approach maps the magnetic field to a readily measurable scalar parameter, thereby providing a reliable, repeatable, and efficient method for precisely quantifying field orientation, a capability highly desirable in research fields such as condensed matter physics and quantum computation.