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IEEE Transactions on Applied Superconductivity

Cryogenic Characterization of a Superconductor Quantum-Based Microwave Reference Source for Communications and Quantum Information

Alírio Boaventura, Justus A. Brevik, Dylan Forrest Williams, Nathan E. Flowers-Jacobs, Manuel A. Castellanos-Beltran, Anna E. Fox, P. F. Hopkins, Paul D. Dresselhaus, Samuel P. Benz

Published Oct 13, 2021• 8 citations
Publisher

Abstract

We are developing a new instrument, the RF Josephson arbitrary waveform synthesizer (RF-JAWS), for communications metrology and quantum information applications. An important aspect of the RF-JAWS design is the accurate and traceable characterization of its superconducting devices. In this article, we present a procedure for characterizing microwave superconducting devices in a cryogenic RF probe station via a vector network analyzer (VNA) calibrated with a custom cryogenic calibration kit colocated with the superconducting device under test (DUT) in the cryogenic environment. By de-embedding lossy and dispersive RF interconnects linking the superconducting DUT to the measurement apparatus at room temperature, we characterize the DUT exactly at the cryogenic on-wafer reference plane. More importantly, we operate our VNA with an external modulated source and our procedure features metrology-grade multiline thru-reflect-line calibration and absolute power and phase corrections, as opposed to the more common relative scattering-parameter correction. In addition, we apply anX-parameter model to account for impedance mismatch in cryogenic Josephson microwave sources. Our techniques are also suitable for cryogenic characterization of microwave superconducting devices for solid-state quantum computers and could help to optimize the quantum-classical interfaces in these systems.

DOI
10.1109/tasc.2021.3117610

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We are developing a new instrument, the RF Josephson arbitrary waveform synthesizer (RF-JAWS), for communications metrology and quantum information applications. An important aspect of the RF-JAWS design is the accurate and traceable characterization of its superconducting devices. In this article, we present a procedure for characterizing microwave superconducting devices in a cryogenic RF probe station via a vector network analyzer (VNA) calibrated with a custom cryogenic calibration kit colocated with the superconducting device under test (DUT) in the cryogenic environment. By de-embedding lossy and dispersive RF interconnects linking the superconducting DUT to the measurement apparatus at room temperature, we characterize the DUT exactly at the cryogenic on-wafer reference plane. More importantly, we operate our VNA with an external modulated source and our procedure features metrology-grade multiline thru-reflect-line calibration and absolute power and phase corrections, as opposed to the more common relative scattering-parameter correction. In addition, we apply anX-parameter model to account for impedance mismatch in cryogenic Josephson microwave sources. Our techniques are also suitable for cryogenic characterization of microwave superconducting devices for solid-state quantum computers and could help to optimize the quantum-classical interfaces in these systems.
We report on the calibration of quantum-based radio frequency waveforms generated by a Josephson arbitrary waveform synthesizer system. We measure these waveforms using a vector network analyzer and calibrate them at 4 K using a custom-designed cryogenic on-wafer multi-line thru-reflect-line calibration kit and a two-tier calibration procedure. The signals tested in this work can be used as reference signals to calibrate measurement instruments with potential benefits in terms of accuracy and flexibility compared to the conventional methods.
Accurate knowledge of the microwave power delivered to a cryogenic device under test (DUT) is essential for the characterization and operation of superconducting quantum circuits. However, this information is difficult to obtain inside dilution refrigerators because of distributed attenuation, impedance mismatch, switch-path repeatability, and temperature-dependent microwave components. This paper presents an in situ measurement method for RF power at the cryogenic device plane. The method uses a custom variable temperature stage (VTS) as a cryogenic thermal-transfer element. The TVS is alternately heated by a four-wire DC heater and by microwave power dissipated in a 20 dB pass-through attenuator. By fitting the thermal transients and comparing the corresponding steady-state temperatures, the absorbed microwave power is inferred from a directly measured DC electrical power through an AC/DC substitution procedure. The finite reflection and transmission of the attenuator are then accounted for by cryogenic two-port scattering-parameter measurements based on a switch-assisted Short--Open--Load--Reciprocal calibration, so that the result is referred to the DUT reference plane. The system is demonstrated in a dilution refrigerator with powers between -43 and -58 dBm at the DUT input plane. The demonstrated relative standard uncertainty ranges from about 2% at -43.9 dBm to about 40% at -57.6 dBm. The proposed approach combines thermal RF power transfer, cryogenic S-parameter correction, and uncertainty evaluation in a measurement architecture compatible with quantum-device experiments, providing a practical route toward traceable microwave-power calibration at millikelvin stages.
This article presents a superconducting voltage source that generates modulated microwave waveforms with quantum-based stability. The voltage source—an RF Josephson Arbitrary Waveform Synthesizer (RF-JAWS)—uses a superconducting IC with an array of 4500 series-connected Josephson junctions (JJs) that are embedded in a coplanar waveguide (CPW) transmission line. The JJs are driven with 100-ps wide current pulses that force each JJ to generate voltage pulses with a quantized integrated area. A pulse sequence is created using a delta-sigma ($\Delta –––\Sigma )algorithmtogeneratea101−tonewaveformwitha40−MHzinstantaneousbandwidtharound1005MHzwithaflatpowerdistributionof−53dBmandaSchroederphasedistribution.TheJJ’squantum−basednonlinearityproducesanamplitudestabilitywithrespecttovariousdriveandbiasparametersof±0.005dBandadetrendedphasestabilityof±0.05°.Thestabilityofthesourceisverifiedwithouttheneedforcalibratedmeasurements.Another) algorithm to generate a 101-tone waveform with a 40-MHz instantaneous bandwidth around 1005 MHz with a flat power distribution of −53 dBm and a Schroeder phase distribution. The JJ’s quantum-based nonlinearity produces an amplitude stability with respect to various drive and bias parameters of ±0.005 dB and a detrended phase stability of ±0.05°. The stability of the source is verified without the need for calibrated measurements. Another)algorithmtogeneratea101−tonewaveformwitha40−MHzinstantaneousbandwidtharound1005MHzwithaflatpowerdistributionof−53dBmandaSchroederphasedistribution.TheJJ’squantum−basednonlinearityproducesanamplitudestabilitywithrespecttovariousdriveandbiasparametersof±0.005dBandadetrendedphasestabilityof±0.05°.Thestabilityofthesourceisverifiedwithouttheneedforcalibratedmeasurements.Another\Delta –––\Sigma $pulse sequence generates a 10-MHz quadrature-phase shift-keying (QPSK) waveform on a 1005-MHz carrier that has the same stability and the mean error vector magnitude (EVM) of −48 dB. This work is a step toward creating a quantum-based reference source for power and cross-frequency phase calibrations, as well as a reference-modulated signal source for calibrating telecommunication links.
We demonstrate a cryogenic electro-optic sampling (EOS) setup that allows for the measurement of microwave signals at arbitrary positions on a cryogenic chip-scale device. We use a Josephson Arbitrary Waveform Synthesizer (JAWS) to generate quantum-accurate voltage signals and measure them with the EOS setup, allowing for the calibration of its response, yielding traceability of the microwave measurements to a quantum standard. We use the EOS setup to determine the time-domain response of ultrafast cryogenic photodiodes and the electrical reflection coefficient, i.e., the S11 scattering parameter, in a superconducting transmission line. Finally, we introduce an optical femtosecond pulse source which can be used to study the fidelity of superconducting transmission lines and terminations, as well as reflections from elements like Josephson junction arrays imbedded in them.
Microwave devices capable of near-quantum-limited signal processing are essential components in the toolbox of solid-state quantum technologies. The manipulation and readout of single-photon microwave signals through amplifiers, mixers, isolators, etc. must fulfill strict requirements in terms of signal integrity to ensure reliable operation. These active microwave quantum devices operate in complex cryo-electronic setups. This poses challenges to their characterization, since all relevant figures of merit must be expressed at the reference planes of their ports. Even though cryogenic S-parameter calibration is non-trivial, metrological approaches are converging toward rigorous methods. Furthermore, preserving signal integrity must be quantified via absolute noise levels at the ports of the Device Under Test (DUT), requiring an absolute power reference. In this work, we present an in situ noise metrology protocol based on substituting a controllable noise source for the DUT. We motivate this choice by showing that placing the noise source at the DUT input impacts the separability of the calibration from the DUT characteristics. Our proposed architecture combines Planck spectroscopy using a Variable Temperature Stage with Short-Open-Load-Reciprocal scattering-parameter calibration, so that noise and scattering quantities are referred to the same cryogenic reference planes. In this configuration, the readout-chain calibration is separated from the internal dynamics of the DUT. As a demanding use case, we apply the protocol to a Josephson Traveling Wave Parametric Amplifier and extract its gain and input-referred added noise under pump conditions activating multimode nonlinear behavior. This illustrates how our device-agnostic protocol supports portable noise characterization of nonlinear cryogenic microwave devices.