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IEEE Transactions on Applied Superconductivity

Microwave Modeling and Characterization of Superconductive Circuits for Quantum Voltage Standard Applications at 4 K

Alírio Boaventura, Dylan Forrest Williams, Richard Chamberlin, Jérôme Chéron, Anna E. Fox, Paul D. Dresselhaus, P. F. Hopkins, Ian W. Haygood, Samuel P. Benz

Published Jan 1, 2020• 16 citations
Publisher

Abstract

In this article, we characterize the microwave behavior of superconductive circuits for quantum voltage standard applications at 4 K. For that, we develop a cryogenic multiline thru-reflect-line (TRL) calibration procedure to calibrate the microwave measurements at the 4 K on-wafer reference plane. We model superconductive circuits, including a Josephson array transmission line, compare simulated to TRL-calibrated measured results, and find excellent agreement up to 50 GHz.

DOI
10.1109/tasc.2019.2963403

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In this article, we characterize the microwave behavior of superconductive circuits for quantum voltage standard applications at 4 K. For that, we develop a cryogenic multiline thru-reflect-line (TRL) calibration procedure to calibrate the microwave measurements at the 4 K on-wafer reference plane. We model superconductive circuits, including a Josephson array transmission line, compare simulated to TRL-calibrated measured results, and find excellent agreement up to 50 GHz.
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