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The Japan Society of Applied Physics

Photocurrent detection of NV centers in diamond using a device structure

Masafumi Shiigai, Takuya Murooka, B. Yang, Toshiharu Makino, Hiromitsu Kato, Masahiko Ogura, Satoshi Yamasaki, Mutsuko Hatano, Takayuki Iwasaki

Published Jan 28, 2020• 0 citations
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Photoelectrical readout of the electronic spin state of the nitrogen-vacancy (NV) center in diamond is attracting significant interest due to the numerous advantages it possesses compared with conventional fluorescence readout. The higher charge carrier rate compared to the photon rate and the integration of the detection scheme on a chip can significantly advance quantum sensing and computing with color centers in diamond. Until now, photoelectric readout has been performed on ensembles of NV centers or single NV centers deep in ultrapure diamond substrates. However, many applications require the artificial creation and precise placement of shallow NV centers, and photoelectric detection of such centers has been challenging. Here we demonstrate photoelectrical readout and coherent control of the electronic spin of implanted shallow ($\sim$10 nm) NV centers buried by diamond overgrowth. The photoelectrically measured Ramsey T2∗T_2^*T2∗​ agrees with conventional fluorescence readout and shows no measurable dependence on the readout photocurrent, for both shallow implanted and deep ingrown NV centers. We further find that overgrowth improves photoelectric readout by suppressing the background photocurrent. These results establish photoelectric readout as a viable route to chip-integrated, electrically detected nanoscale sensing and to spin registers based on engineered shallow NV centers.
Solid-state technologies for quantum mechanical application require delicate materials that can operate stably with a long coherence time. Nitrogen vacancy (NV) centers in diamond is one of the most promising candidates for quantum physics, with applications such as single photon emitters, quantum computation, and magnetic sensor.\n\nTo fully exploit the capability of defect centers in diamond for opto-electronics and quantum engineering, a number of improvements are needed. Among these are optimization of the NV centers yield in bulk diamond, nanodiamond (ND) size reduction, photocurrent study of the defect band-trap electronic structure in diamonds, and optimization of high-speed NV qubit control. For NV centers yield optimization, both the experimental magnetic sensitivity optimization as well as theoretical simulation of NV concentration are implemented. For NDs size characterization, we analyzed the size and photon autocorrelation function of NV in NDs after air oxidation treatment using a combined atomic force microscopy/confocal system. To study defect band-trap electronic structure in diamond, excitation and quenching as well as the recovery of the quenched photocurrent was investigated to better understand photocurrent dynamics in diamond. For qubit high-speed control optimization, a microwave pulse based on a nonlinear numeric solution of the Schrodinger equation is used to rotate the NV spin faster than the ordinary Rabi flip rate. Together these approaches promise to significantly speed up the development of diamond for quantum engineering applications.
Abstract The photoelectric detection of nitrogen‐vacancy (NV) magnetic resonance (PDMR) in diamond, used for spin state detection and based on reading the photocurrent resulting from NV ionization, offers physical and technical advantages for the development of miniaturized and scalable quantum sensors, as well as solid‐state quantum information devices integrated with electronics. Charge exchanges between NV centers and other optoelectrically active defects in diamond are an essential part of the PDMR scheme, impacting the spin‐state control and the performances of the photoelectric readout. Through experimental characterization and modeling, processes governing the spin‐state contrast, in particular the hole carrier contribution to the photocurrent and the role of acceptor‐type defects are discussed. Such acceptor defects can act as traps for free electrons resulting from NV photoionization. Consequently, the hole current can increase at resonance, ultimately leading to an inversion of the sign of PDMR resonances, i.e. to a positive spin contrast. Based on these findings, a method to improve PDMR performances in terms of spin contrast and photoelectric detection rate by selectively ionizing low‐energy acceptor defects using a bias red illumination is proposed. This method is shown to lead to a significant improvement of the photoelectric spin detection sensitivity, important for future practical devices.