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The Japan Society of Applied Physics

Study on superconducting nano-structured line drivers for 1-Gb Josephson-CMOS hybrid memory

Kyosuke Sano, Kohei Maruyama, Masamitsu Tanaka, Taro Yamashita, M. Inoue, Akira Fujimaki

Published Jan 25, 2019• 0 citations
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IEEE Transactions on Applied Superconductivity•Dec 30, 2016•40 citations
In this study, we aimed to achieve high-speed readout operations of Josephson–CMOS hybrid memory. We first experimentally evaluated the timing margin in the readout operations of the hybrid memory. In single-channel bit line measurements, we confirmed that the hybrid memory could work at a 1-GHz memory clock frequency with a timing margin as high as 0.63 ns. Subsequently, we designed and measured a Josephson–CMOS hybrid accumulator circuit to demonstrate high-speed read operations of the hybrid memory. The core design of the Josephson–CMOS hybrid memory follows our previous design. We introduced a sequential-access read-only CMOS memory and a single-flux-quantum accumulator into a test circuit, enabling high-speed measurement of Josephson–CMOS hybrid memory with only two high-speed external inputs. We designed and fabricated a test circuit using the Rohm 180-nm CMOS process and the AIST-ADP2 Josephson process. In the measurement, we achieved correct operation of the test circuit, including the readout operation of the 32-b hybrid memory at a memory clock frequency as high as 1.2 GHz, corresponding to a 38.4-Gb/s readout.
We present hybridization of Josephson, CMOS, and nanocryotron (nTron) devices for a large-scale cryogenic memory application. The memory system proposed here is dynamic random access memory composed of address decoders based on an energy-efficient rapid single-flux-quantum logic, nTron line drivers, a CMOS memory cell array, and Josephson current sensors. Because drivers with voltage amplification and decoders are the major causes of power dissipation in the conventional Josephson-CMOS hybrid memory, drastic reduction in power consumption is expected. We show estimates that the power consumption of a 16-Mb memory is reduced to 1.36-2.77 mW, approximately 1/12 of the conventional Josephson-CMOS hybrid memory, and the access time is 0.78 ns for a read operation, when we assume a 65-nm CMOS process and a 1.0-μm Nb/AlOx/Nb process. In the preliminary experiment, we fabricated nTrons using NbTiN thin film that are suitable for hybrid memory implementation, and measured with eight-transistor static random access memory cells fabricated using the Rohm 0.18-μm CMOS process. We successfully triggered the nTron into the normal state, and observed output voltage of ~0.1 V at 13.5 K. The experimental results support the potential of the hybrid memory using NbTiN nTrons.