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Journal of Low Temperature Physics

Investigation of Single-Crystal Niobium for Microwave Kinetic Inductance Detectors

Agnès Dominjon, S. Shu, M. Kroug, Takashi Noguchi, Yutaro Sekímoto, Wenlei Shan, Shigeyuki Sekiguchi, Tom Nitta

Published Dec 5, 2018• 5 citations
Publisher
DOI
10.1007/s10909-018-2101-2

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Abstract A microwave kinetic inductance detector (MKID) is a cutting-edge superconducting detector. It comprises a resonator circuit constructed with a superconducting film on a dielectric substrate. To expand its field of application, it is important to establish a method to suppress the two-level system (TLS) noise that is caused by the electric fluctuations between the two energy states at the surface of the substrate. The electric field density can be decreased by expanding the strip width (S) and gap width from the ground plane (W) in the MKID circuit, allowing the suppression of TLS noise. However, this effect has not yet been confirmed for MKIDs made with niobium films on silicon substrates. In this study, we demonstrate its effectiveness for such MKIDs. We expanded the dimension of the circuit from (S, W) = (3.00 μm, 4.00 μm) to (S, W) = (5.00 μm, 23.7 μm), and achieved an increased suppression of 5.5 dB in TLS noise.
We designed and fabricated a microwave kinetic inductance detector (MKID) using a niobium nitride (NbN) symmetric spiral resonator array. Previously we revealed that a rewound spiral structure works as not only a high-Q half-wavelength resonator but also as a broadband terahertz antenna. We conducted simulations for a 9 resonator array assuming NbN as the superconducting material and sapphire as the dielectric substrate, and obtained a maximum attenuation of over 30 dB and unloaded quality factors of over 2 × 10 5 for frequencies between 4.4 and 4.9 GHz. We fabricated the 9 resonator array MKID using NbN thin film deposited on an m-sapphire substrate by using dc magnetron sputtering. We observed half-wavelength resonances of around 4.5 GHz at 4 K. We measured the optical response of the MKID. The frequency shift was 0.5 MHz when illuminated with 650 nm photons.
To improve the performance of state-of-the-art superconducting quantum devices, microwave loss due to defects at amorphous interfacial layers must be reduced, via proper surface treatment. The authors study niobium resonators after removing native oxides by HF etching, which reduces losses about tenfold and yields a quality factor of $7\ifmmode\times\else\texttimes\fi{}{10}^{6}$ in the single-photon limit. Losses reappear as oxides form upon exposure to air; Nb2{}_{2}2​O5{}_{5}5​ is the only surface oxide that grows significantly in the first week. These findings are of interest for a panoply of devices, inluding superconducting qubits, quantum-limited amplifiers, microwave kinetic-inductance detectors, and single-photon detectors.