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arXiv:2110.00127 · Progress of Theoretical and Experimental Physics

Characterization of two-level system noise for a microwave kinetic inductance detector comprising niobium film on a silicon substrate

Yoshinori Sueno, S. Honda, Hiroki Kutsuma, S. Mima, Chiko Otani, S. Oguri, Junya Suzuki, O. Tajima

Published Jan 31, 2022• 5 citations
arXivHTMLPDF

Abstract

Abstract A microwave kinetic inductance detector (MKID) is a cutting-edge superconducting detector. It comprises a resonator circuit constructed with a superconducting film on a dielectric substrate. To expand its field of application, it is important to establish a method to suppress the two-level system (TLS) noise that is caused by the electric fluctuations between the two energy states at the surface of the substrate. The electric field density can be decreased by expanding the strip width (S) and gap width from the ground plane (W) in the MKID circuit, allowing the suppression of TLS noise. However, this effect has not yet been confirmed for MKIDs made with niobium films on silicon substrates. In this study, we demonstrate its effectiveness for such MKIDs. We expanded the dimension of the circuit from (S, W) = (3.00 μm, 4.00 μm) to (S, W) = (5.00 μm, 23.7 μm), and achieved an increased suppression of 5.5 dB in TLS noise.

DOI
10.1093/ptep/ptac023

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Over the past two decades, microwave kinetic inductance detectors (MKIDs) have gained exceptional importance in millimeter and sub-millimeter astronomy. MKIDs consist of thin strip resonators capable of detecting changes in the surface impedance of superconductor strips, which result from variations in resonance circuit properties. The principal noise in MKIDs comprises excess frequency noise and two-level system noise. In this paper, we propose a technique to mitigate the effect of two-level system (TLS) noise in MKIDs using a parallel plate capacitor with three layers of high ε dielectrics. To achieve this, we employ three layers of Al2O3, HfO2, and TiO2 with equal thickness between the capacitor plates. The experimental results demonstrate a nearly 30% reduction in TLS power spectral density.

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Context. Microwave kinetic inductance detectors (MKIDs) are superconducting detectors that have the potential to contribute to the construction of over 10 000 pixel cameras required for mm and submm astronomical observations over the next decade. One of the issues related to its application is two-level-system (TLS) noise that creates a 1/ f term in the power spectrum density (PSD) of the detectors. A hybrid-type MKID has been proposed for TLS noise suppression without affecting the MKID performance. In this paper, we present a systematic method to model a hybrid-type MKID for mitigating TLS noise while achieving high sensitivity. Aims. Previous studies have shown that TLS noise in MKIDs depends on the sampling frequency, internal power, device geometry, and temperature. The strength of the electrical field distribution along the resonator line also affects the TLS noise properties. Based on this knowledge, we constructed a noise model of a hybrid-type MKID. Methods. Using this model, we designed MKIDs for the cosmic microwave background radiation experiment, GroundBIRD. We evaluated the 1/ f noise properties and NET of the fabricated devices using the on-site measurements. Based on the NET measurements, we can confirm that the white noise of fabricated detectors is limited by atmospheric photon noise. From the 1/ f noise measurements, we also confirm that it is possible to reach an atmospheric photon noise limit down to a low sampling frequency (i.e., of a few Hz) at the typical observation conditions from Teide observatory. Results. We confirm the design methodology we propose for hybrid-type MKID works well in optimizing the TLS model to the hybrid-type MKID, as evidenced by performance verification measurements carried out in the laboratory and on site.

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As a newly developed pair-breaking superconducting detector, microwave kinetic inductance detectors are simple to integrate in the frequency domain and have already been used in astronomical detection and array imaging at the (sub)millimeter and optical wavelengths. For these applications, the dark noise level of kinetic inductance detector is one of the key performance indicators. Herein a noise power spectrum analysis method is introduced in detail, which can accurately and effectively analyze the noise spectrum of kinetic inductance detector in a wide frequency range. This method can well balance the noise spectrum resolution and variance performance, by taking the noise data at the resonance frequency with two sampling rates and setting the appropriate frequency resolutions for different frequency bands. This method is used to characterize and compare the noise of aluminum (Al) kinetic inductance detectors made from two different micromachining processes. We deposite a 25-nm-thick aluminum film on high-resistivity silicon substrate for one device, while place one silicon nitride (SiNx) film on the top and one on the bottom of the aluminum film for another device. It is found that the frequency noise of the device with two silicon nitride films is about 25% to 50% of the bare aluminum device. Using this double silicon nitride film fabrication technique, we further fabricate a few groups of lumped-element aluminum kinetic inductance detectors with various inductor and interdigitated capacitor designs. We investigate the noise properties of these devices at different microwave driven power and bath temperatures, and the experimental results show typical two-level system noise behaviors. Our work provides a standard method to characterize the noise power spectrum of kinetic inductor detector, and also paves the way to developing low-noise aluminum kinetic inductance detectors for terahertz imaging, photon-counting and energy-resolving applications.

Acta Physica Sinica•Nov 9, 2023•1 citation
Abstract A microwave kinetic inductance detector (MKID) is a cutting-edge superconducting detector. It comprises a resonator circuit constructed with a superconducting film on a dielectric substrate. To expand its field of application, it is important to establish a method to suppress the two-level system (TLS) noise that is caused by the electric fluctuations between the two energy states at the surface of the substrate. The electric field density can be decreased by expanding the strip width (S) and gap width from the ground plane (W) in the MKID circuit, allowing the suppression of TLS noise. However, this effect has not yet been confirmed for MKIDs made with niobium films on silicon substrates. In this study, we demonstrate its effectiveness for such MKIDs. We expanded the dimension of the circuit from (S, W) = (3.00 μm, 4.00 μm) to (S, W) = (5.00 μm, 23.7 μm), and achieved an increased suppression of 5.5 dB in TLS noise.
Over the past two decades, microwave kinetic inductance detectors (MKIDs) have gained exceptional importance in millimeter and sub-millimeter astronomy. MKIDs consist of thin strip resonators capable of detecting changes in the surface impedance of superconductor strips, which result from variations in resonance circuit properties. The principal noise in MKIDs comprises excess frequency noise and two-level system noise. In this paper, we propose a technique to mitigate the effect of two-level system (TLS) noise in MKIDs using a parallel plate capacitor with three layers of high ε dielectrics. To achieve this, we employ three layers of Al2O3, HfO2, and TiO2 with equal thickness between the capacitor plates. The experimental results demonstrate a nearly 30% reduction in TLS power spectral density.
Context. Microwave kinetic inductance detectors (MKIDs) are superconducting detectors that have the potential to contribute to the construction of over 10 000 pixel cameras required for mm and submm astronomical observations over the next decade. One of the issues related to its application is two-level-system (TLS) noise that creates a 1/ f term in the power spectrum density (PSD) of the detectors. A hybrid-type MKID has been proposed for TLS noise suppression without affecting the MKID performance. In this paper, we present a systematic method to model a hybrid-type MKID for mitigating TLS noise while achieving high sensitivity. Aims. Previous studies have shown that TLS noise in MKIDs depends on the sampling frequency, internal power, device geometry, and temperature. The strength of the electrical field distribution along the resonator line also affects the TLS noise properties. Based on this knowledge, we constructed a noise model of a hybrid-type MKID. Methods. Using this model, we designed MKIDs for the cosmic microwave background radiation experiment, GroundBIRD. We evaluated the 1/ f noise properties and NET of the fabricated devices using the on-site measurements. Based on the NET measurements, we can confirm that the white noise of fabricated detectors is limited by atmospheric photon noise. From the 1/ f noise measurements, we also confirm that it is possible to reach an atmospheric photon noise limit down to a low sampling frequency (i.e., of a few Hz) at the typical observation conditions from Teide observatory. Results. We confirm the design methodology we propose for hybrid-type MKID works well in optimizing the TLS model to the hybrid-type MKID, as evidenced by performance verification measurements carried out in the laboratory and on site.
Noise performance is one of the most crucial aspects of any detector. Superconducting Microwave Kinetic Inductance Detectors (MKIDs) have an “excess” frequency noise that shows up as a small time dependent jitter of the resonance frequency characterized by the frequency noise power spectrum measured in units of Hz2/Hz. Recent studies have shown that this noise almost certainly originates from a surface layer of two‐level system (TLS) defects on the metallization or substrate. Fluctuation of these TLSs introduces noise in the resonator due to coupling of the TLS electric dipole moments to the resonator’s electric field. Motivated by a semi‐empirical quantitative theory of this noise mechanism, we have designed and tested new resonator geometries in which the high‐field “capacitive” portion of the CPW resonator is replaced by an interdigitated capacitor (IDC) structure with 10–20 μm electrode spacing, as compared to the 2 μm spacing used for our more conventional CPW resonators. Measurements show that this new IDC design has dramatically lower TLS noise, currently by about a factor of ∼29 in terms of the frequency noise power spectrum, corresponding to an improvement of about a factor of 29 in NEP. These new devices are replacing the CPW resonators in our next design iteration in progress for MKIDCam. Opportunities and prospects for future reduction of the TLS noise will be discussed.
Excess phase noise has been observed in microwave kinetic inductance detectors (MKIDs) which prevents the noise-equivalent power (NEP) of current detectors from reaching theoretical limits. One characteristic of this excess noise is its dependence on the power of the readout signal: the phase noise decreases as the readout power increases. We investigated this power dependence in a variety of devices, varying the substrate (silicon and sapphire), superconductor (aluminum and niobium) and resonator parameters (resonant frequency, quality factor and resonator geometry). We find that the phase noise has a power law dependence on the readout power, and that the exponent is -1/2 in all our devices. We suggest that this phase noise is caused by coupling between the high-Q microwave resonator that forms the sensitive element of the MKID and two-level systems associated with disorder in the dielectric material of the resonator. The physical situation is analogous to the resonance fluorescence in quantum optics, and we are investigating the application of resonance fluorescence theory to MKID phase noise.
The separation and optimization of noise components is critical to microwave-kinetic inductance detector (MKID) development. We analyze the effect of several changes to the lumped-element inductor and interdigitated capacitor geometry on the noise performance of a series of MKIDs intended for millimeter-wavelength experiments. We extract the contributions from two-level system noise in the dielectric layer, the generation-recombination noise intrinsic to the superconducting thin-film, and system white noise from each detector noise power spectrum and characterize how these noise components depend on detector geometry, material, and measurement conditions such as driving power and temperature. We observe a reduction in the amplitude of two-level system noise with both an elevated sample temperature and an increased gap between the fingers within the interdigitated capacitors for both aluminum and niobium detectors. We also verify the expected reduction of the generation-recombination noise and associated quasiparticle lifetime with reduced inductor volume. This study also iterates over different materials, including aluminum, niobium, and aluminum manganese, and compares the results with an underlying physical model.
As a newly developed pair-breaking superconducting detector, microwave kinetic inductance detectors are simple to integrate in the frequency domain and have already been used in astronomical detection and array imaging at the (sub)millimeter and optical wavelengths. For these applications, the dark noise level of kinetic inductance detector is one of the key performance indicators. Herein a noise power spectrum analysis method is introduced in detail, which can accurately and effectively analyze the noise spectrum of kinetic inductance detector in a wide frequency range. This method can well balance the noise spectrum resolution and variance performance, by taking the noise data at the resonance frequency with two sampling rates and setting the appropriate frequency resolutions for different frequency bands. This method is used to characterize and compare the noise of aluminum (Al) kinetic inductance detectors made from two different micromachining processes. We deposite a 25-nm-thick aluminum film on high-resistivity silicon substrate for one device, while place one silicon nitride (SiNx) film on the top and one on the bottom of the aluminum film for another device. It is found that the frequency noise of the device with two silicon nitride films is about 25% to 50% of the bare aluminum device. Using this double silicon nitride film fabrication technique, we further fabricate a few groups of lumped-element aluminum kinetic inductance detectors with various inductor and interdigitated capacitor designs. We investigate the noise properties of these devices at different microwave driven power and bath temperatures, and the experimental results show typical two-level system noise behaviors. Our work provides a standard method to characterize the noise power spectrum of kinetic inductor detector, and also paves the way to developing low-noise aluminum kinetic inductance detectors for terahertz imaging, photon-counting and energy-resolving applications.