IEEE International Superconductive Electronics Conference (ISEC)
Experimental Investigation of ERSFQ Circuit for Parallel Multibit Data Transmission
Timur V. Filippov, Denis Amparo, Michael Y. Kamkar, Jason Walter, Alex F. Kirichenko, Oleg A. Mukhanov, I. V. Vernik
Abstract
We present test results for parallel data communication ERSFQ circuits with clock recovery. We experimentally study on-chip and chip-to-chip parallel data communication circuits with 4-, 8- and 16-bit word lengths. The largest circuit is a 16-bit chip-to-chip communication test circuit embedded into a testbed with clock distributed over a combination of active and passive transmission lines with transmitter/receiver pairs, and is comprised of 3464 Josephson junctions in total. All ERSFQ circuits are fabricated using MITLL 10-kA/cm2SFQ5ee process. For the chip-to-chip communication experiment, a multi-chip module (MCM) is assembled using Hypres' MCM flip-chip bonding process which connected the MIT-LL-made flip-chip to the Hypres-made MCM carrier using 220 signal bumps with 50 um pitch. We experimentally confirmed correct functionality of 4-, 8- and 16-bit circuits and measured their current bias margins. For the 16- bit chip-to-chip communication circuit mounted to a MCM, we measured ±12% dc bias margins similar to the margins measured for the on-chip version of the same circuit. The MCM circuit is also evaluated at high clock speed generated by an external source, while the data words are changed at low speed. The correct functionality is observed without significant reduction in the bias margins using average-voltage test approach.