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International Conference on Millimeter and Submillimeter Waves and Applications 1994

The discovery of a technique to measure the spatial profile of microwave frequency superconducting current densities

Jim C. Culbertson

Published Jan 1, 1994• 1 citation
Publisher

Abstract

We have discovered that the optically induced shift in the resonance frequency of a resonant superconducting device is proportional to the square of the local superconducting current density. Using rapidly modulated, highly focused light sources, such measurements, performed as a function of position, can be useful in the study and design of superconducting devices.

DOI
10.1117/12.2303194

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We have discovered that the optically induced shift in the resonance frequency of a resonant superconducting device is proportional to the square of the local superconducting current density. Using rapidly modulated, highly focused light sources, such measurements, performed as a function of position, can be useful in the study and design of superconducting devices.
Abstract We report a technique for measuring the spatial profile of microwave‐frequency currents in resonant thin‐film superconducting microstrip devices operated near resonance. We probe the patterned superconducting device as a function of position by scanning a modulated light beam across the region to be probed. With the light focused to a spot size much smaller than the microstrip width, we have measured the current density distribution as a function of position across the width of the strip. Using an elementary model for the superconducting current density distribution, we fit an effective penetration depth at the edge of the microstrip. © 1993 John Wiley & Sons, Inc.
Superconducting qubits, though promising for both near-term problem-solving as well as the development of large-scale quantum computing systems, are limited in performance largely by materials-induced decoherence channels which are maximized at millikelvin temperatures, single photon powers, and microwave frequencies. Superconducting microwave resonators are ideal tools for measuring these materials losses due to their simplicity, well-understood behavior, and sensitivity to these same losses. In order to better understand and mitigate dominant qubit decoherence channels, accurate and precise characterization of superconducting microwave resonator performance is critical. In this paper, current measurement techniques for superconducting microwave resonators are discussed, including experimental set-up, error analysis, and cryogenic calibration of a vector network analyzer.
This work presents new experimental results on low-temperature (LT) characterization of local RF properties of passive superconducting (SC) microwave devices using a novel laser scanning microscope (LSM). In this technique, a modulated laser beam is focused onto and scanned over the surface of a resonant SC device to probe the spatial distribution of RF current. The highly localized photo-induced change of the kinetic inductance of the SC device produces both a shift of the resonant frequency f/sub 0/ and change of the quality factor Q. An image of these changes is recorded as the laser spot is scanned over the device. We present the first measurements of spatially resolved intermodulation response in a high temperature superconducting (HTS) co-planar waveguide resonator, opening up a new window into the local origins of nonlinearity in the HTS materials.