Randomized Benchmarking in a Si/SiGe Triple-Dot Decoherence-Free Subsystem

Magnetic-Field Effects on Error and Leakage in Randomized Benchmarking of a Si/SiGe Triple-dot Qubit

Quantifying error and leakage in an encoded Si/SiGe triple-dot qubit

Charge Noise Characterization in SiGe Triple-Dot Qubits

Noise correlations in a two-qubit Si/SiGe quantum dot device

Experimental Measurement of Leakage-Error in Exchange-Only SiGe Quantum Dot Qubits by Extending Randomized Benchmarking

Characterization of gate fidelities in a Si/SiGe two-qubit device