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Bulletin of the American Physical Society

Experimental Measurement of Leakage-Error in Exchange-Only SiGe Quantum Dot Qubits by Extending Randomized Benchmarking

Aaron Weinstein

Published Mar 8, 2018• 0 citations
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Bulletin of the American Physical Society•Mar 3, 2015•0 citations
We demonstrate rapid high-fidelity state preparation and measurement in exchange-only Si/SiGe triplequantum-dot qubits.Fast measurement integration (980-ns) and initialization (approximately 300-ns) operations are performed with all-electrical baseband control.We emphasize a leakage-sensitive joint initialization and measurement metric, developed in the context of exchange-only qubits but applicable more broadly, and report an infidelity of 2.5 ± 0.5×10 -3 .This result is enabled by a high-valley-splitting heterostructure, initialization at the two-to three-electron charge boundary, and careful assessment and mitigation of T 1 during spin-to-charge conversion.The ultimate fidelity is limited by a number of comparably important factors and we identify clear paths toward further improved fidelity and speed.Along with an observed single-qubit randomized benchmarking error rate of 1.7 × 10 -3 , this work demonstrates initialization, control, and measurement of Si/SiGe triple-dot qubits at fidelities and durations that are promising for scalable quantum information processing.
Leakage is a quantum error process in which a qubit ends up in a state outside of the computational subspace. In trapped-ion hyperfine qubits, leakage can occur as a result of spontaneous emission from an excited state during a two-qubit gate. This error can be detected by a circuit gadget that couples a data qubit to an ancilla qubit, followed by a measurement of the ancilla. The effects of leakage errors on the circuit can then be removed by post-selecting shots in which leakage was not detected. We first experimentally demonstrate improved two-qubit gate fidelity as measured by randomized benchmarking and cycle benchmarking. We then benchmark the use of leakage detection on system-level mirror benchmarking circuits. Finally, we present a protocol to measure the failure rate of the leakage detection gadget, defined as the probability that the gadget produces an error on the data qubit while not heralding the ancilla.