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International Conference on Solid State Devices and Materials (SSDM)

Measurements on a High-Tc RSFQ Circuit at 4.2K

Z. G. Ivanov, V. K. Kaplunenko, Е. А. Степанцов, E. Wikborg, T. Claeson

Published Aug 30, 1993• 0 citations
Publisher
DOI
10.7567/ssdm.1993.lc-16

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In recent years, rapid single flux quantum (RSFQ) circuits, which are promising for the development of high-speed digital electronics, have attracted widespread interest. Niobium nitride (NbN) films have also attracted significant attention for high-frequency applications in superconducting electronics because of their superior material parameters, including their high critical temperature Tc and large gap voltage Vg. To enable the development of all-NbN SFQ circuits, we have developed a fabrication process based on NbN junctions and inductors made of NbN strip lines. It is important to evaluate the inductance because it can affect the performance of an RSFQ circuit and is essential for the RSFQ design. We measured the inductance properties of both epitaxial and polycrystalline NbN strip lines using a superconducting quantum interference device modulation technique at 4.2 K and obtained the width dependence on the inductance of the NbN films. The penetration depth was then calculated from these measurements. The NbN inductance values were calculated numerically with respect to the penetration depth and were then compared with the measured values from the experiments. It was demonstrated that the differences between these values were within 5%. The results reported here will be useful for the design and fabrication of all-NbN RSFQ circuits.
A major restriction in the development of a working Rapid Single Flux Quantum (RSFQ) logic circuit with high-Tc superconductors is given by the influence of thermal noise. This gives reason to ask for a general determination of the digital bit error rate. As other approaches, our method of calculating the switching probability is based on the Fokker-Planck equation. In the past few years the bit error rates for a single Josephson junction, SQUIDs and the comparator were calculated by using this theory. We demonstrate numerical solution of the multidimensional Fokker-Planck equation to calculate bit error rates due to thermal noise for a Toggle Flip Flop circuit. In the present work, we combine thermal noise analysis with the effects of process variations in order to derive rules for designing high-Tc RSFQ logic circuits.