Challenges
Datasets
Workspaces
Papers
Discussions
Leaderboard
Log inSign up
Challenges
Datasets
Workspaces
Papers
Discussions
Leaderboard
Blog
Job Board
Q3AS

© 2026 Aqora Quantum S.A.S.

TermsPrivacyLegal Notice

Physica C Superconductivity

Development of highly integrated RSFQ circuits on the basis of intrinsically shunted Josephson junctions

F.-I. Buchholz, D Balashov, M. Khabipov, Daniel Hagedorn, R. Dolata, R. Pöpel, J. Niemeyer

Published Feb 1, 2001• 4 citations
Publisher
DOI
10.1016/s0921-4534(00)01614-2

Related papers

Evaluation of self-shunted SNIS Josephson junctions for RSFQ applications

Pascal Febvre, David Bouis, Natascia De Leo +3 more

•May 27, 2010•0 citations

Design and fabrication of internally shunted tantalum nitride barrier Josephson junctions for RSFQ logic applications

Yu Lei

•Jan 1, 2005•0 citations

SINIS fabrication process for realizing integrated circuits in RSFQ impulse logic

D Balashov, M. Khabipov, F-Im Buchholz +2 more

At PTB, a new type of fabrication process has been developed to verify rapid single flux quantum (RSFQ) integrated circuits based on intrinsically shunted two-tunnel Josephson junctions (JJs). The process has been realized in LTS implementation using SINIS technology. A variety of single JJs, junction arrays and test circuits have been fabricated and experimentally investigated. The critical current densities of the junctions were set to a nominal value of j C = 500 A cm -2 , with values of the characteristic voltage V C equal to or larger than 160 µV. The JJs show nearly hysteresis-free behaviour (less than 10%); the intrawafer parameter spread is smaller than ±10%. Various basic RSFQ circuits have been realized with operation margins of bias currents of larger than ±20%.

Superconductor Science and Technology•Nov 1, 1999•11 citations

Noise analysis for intrinsic and external shunted Josephson junctions

Thomas Ortlepp, Hermann F. Uhlmann

In the design of electronic applications (for example, rapid single flux quantum (RSFQ) circuits), the properties of Josephson junctions (JJs) provided by technology are the major requirement. The characteristic voltage IcRn an dt he dynamic parameter βc are non-negligibly important, bu tt he external shunted junctions are only completely described by including the parasitic inductance between the junction area and the shunt resistor. The first publications of the RSFQ circuit technique were closely followed by many studies on the dynamic influence of this inductance. It has been pointed out that no practical value of this parameter has to be taken into account in the circuit design and optimization process. The operation of RSFQ logic circuits made of high-temperature superconductors (HTS) are strongly influenced by thermal noise. Our paper contains the determination of the digital bit-error rate for all different types of JJs by using a Fokker–Planck equation for describing the influence of thermal fluctuations. Ou ra nalysis shows that the parasitic inductance cannot be neglected in terms of noise. The intrinsic shunted junctions like high current density-, SINIS- and all kinds of HTS-JJs provide the best noise immunity for a fixed temperature.

Superconductor Science and Technology•Feb 19, 2004•19 citations

Development of HTS Josephson Junctions for SFQ Circuits

Wakana Hironori, Seiji Adachi, Tsunehiro Hato +3 more

IEICE Technical Report; IEICE Tech. Rep.•Jan 18, 2008•0 citations

Development of integrated digital circuits with Josephson junctions

W. Jutzi

•Apr 1, 1984•0 citations
At PTB, a new type of fabrication process has been developed to verify rapid single flux quantum (RSFQ) integrated circuits based on intrinsically shunted two-tunnel Josephson junctions (JJs). The process has been realized in LTS implementation using SINIS technology. A variety of single JJs, junction arrays and test circuits have been fabricated and experimentally investigated. The critical current densities of the junctions were set to a nominal value of j C = 500 A cm -2 , with values of the characteristic voltage V C equal to or larger than 160 µV. The JJs show nearly hysteresis-free behaviour (less than 10%); the intrawafer parameter spread is smaller than ±10%. Various basic RSFQ circuits have been realized with operation margins of bias currents of larger than ±20%.
In the design of electronic applications (for example, rapid single flux quantum (RSFQ) circuits), the properties of Josephson junctions (JJs) provided by technology are the major requirement. The characteristic voltage IcRn an dt he dynamic parameter βc are non-negligibly important, bu tt he external shunted junctions are only completely described by including the parasitic inductance between the junction area and the shunt resistor. The first publications of the RSFQ circuit technique were closely followed by many studies on the dynamic influence of this inductance. It has been pointed out that no practical value of this parameter has to be taken into account in the circuit design and optimization process. The operation of RSFQ logic circuits made of high-temperature superconductors (HTS) are strongly influenced by thermal noise. Our paper contains the determination of the digital bit-error rate for all different types of JJs by using a Fokker–Planck equation for describing the influence of thermal fluctuations. Ou ra nalysis shows that the parasitic inductance cannot be neglected in terms of noise. The intrinsic shunted junctions like high current density-, SINIS- and all kinds of HTS-JJs provide the best noise immunity for a fixed temperature.