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Superconductor Science and Technology

Noise analysis for intrinsic and external shunted Josephson junctions

Thomas Ortlepp, Hermann F. Uhlmann

Published Feb 19, 2004• 19 citations
Publisher

Abstract

In the design of electronic applications (for example, rapid single flux quantum (RSFQ) circuits), the properties of Josephson junctions (JJs) provided by technology are the major requirement. The characteristic voltage IcRn an dt he dynamic parameter βc are non-negligibly important, bu tt he external shunted junctions are only completely described by including the parasitic inductance between the junction area and the shunt resistor. The first publications of the RSFQ circuit technique were closely followed by many studies on the dynamic influence of this inductance. It has been pointed out that no practical value of this parameter has to be taken into account in the circuit design and optimization process. The operation of RSFQ logic circuits made of high-temperature superconductors (HTS) are strongly influenced by thermal noise. Our paper contains the determination of the digital bit-error rate for all different types of JJs by using a Fokker–Planck equation for describing the influence of thermal fluctuations. Ou ra nalysis shows that the parasitic inductance cannot be neglected in terms of noise. The intrinsic shunted junctions like high current density-, SINIS- and all kinds of HTS-JJs provide the best noise immunity for a fixed temperature.

DOI
10.1088/0953-2048/17/5/004

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In the design of electronic applications (for example, rapid single flux quantum (RSFQ) circuits), the properties of Josephson junctions (JJs) provided by technology are the major requirement. The characteristic voltage IcRn an dt he dynamic parameter βc are non-negligibly important, bu tt he external shunted junctions are only completely described by including the parasitic inductance between the junction area and the shunt resistor. The first publications of the RSFQ circuit technique were closely followed by many studies on the dynamic influence of this inductance. It has been pointed out that no practical value of this parameter has to be taken into account in the circuit design and optimization process. The operation of RSFQ logic circuits made of high-temperature superconductors (HTS) are strongly influenced by thermal noise. Our paper contains the determination of the digital bit-error rate for all different types of JJs by using a Fokker–Planck equation for describing the influence of thermal fluctuations. Ou ra nalysis shows that the parasitic inductance cannot be neglected in terms of noise. The intrinsic shunted junctions like high current density-, SINIS- and all kinds of HTS-JJs provide the best noise immunity for a fixed temperature.
The influence of thermal noise gives a major restriction in the development of Rapid Single Flux Quantum (RSFQ) logic circuits with high-T/sub c/ superconductors. In the past, we have demonstrated a general way for determining the digital bit error rate and for predicting operation ranges with good noise immunity. The method is based on a single Fokker-Planck equation which includes the full system dynamics. However, the complexity of this equation increases dramatically with the number of Josephson junctions. Our new approach describes a method to divide an RSFQ logic cell into several basic primitives. They can be characterized quickly in terms of switching probability for a lot of different parameters. From these analyses, look-up tables are built-up. We describe how to combine these data in order to achieve the bit-error rate for the whole cell. While saving more than 90% of computation time, the comparison with our previous results for full system analyses shows less than 4% difference. This approach provides for a powerful tool to include the influence of thermal noise into the optimization process of RSFQ logic circuits as well.
The Rapid Single Flux Quantum electronics is a superconducting, naturally digital circuit family which is currently close to getting commercially applied.RSFQ is outstanding by its very low switching energy resulting in a very low power consumption which is the reason for a significant influence on thermal noise.For industrial applications a certain noise immunity is required which is still a challenge especially for circuits of higher complexity.In superconducting electronics resistors are the only on-chip noise sources.We analyzed the influence of each individual resistor in a toggle Flip-Flop circuit to the overall bit-error rate.The shunt resistors of comparator structures are the dominant noise sources and bias resistors have almost no influence.We analyzed in detail the types of thermal introduced switching errors of an toggle Flip-Flop which was optimized with respect to the fabrication yield.Simulation studies were accomplished to investigate the influence of circuit parameters on quality and on quantity of switching errors.By identifying and manipulating the parameters with the most significant influence on the noise susceptibility an enhanced noise immunity of the device can be achieved.The goal is to improve the robustness of RSFQ circuits against the influence of thermal noise for an specific topology by changing the circuit parameters of the device.
Abstract\nThis diploma work is about Rapid Single Flux Quantum (RSFQ) circuits. This\nsupercoducting digital circuitry has the most promising properties in terms of speed and\npower consumption. The active elements of the RSFQ circuits are Josephson junctions (JJ).\nFor their fabrication low temperature superconducting niobium films are used. Today the\ndesign and fabrication of RSFQ circuits are done in a standardized way with well-defined\ndesign rules. Nevertheless, to design complicated circuits with more than several hundred\njunctions a lot of practical problems must be solved.\nDifferent aspects of the RSFQ circuits design process were investigated in this work.\nIn the theoretical part we propose a new, more realistic model of the Josephson junction for\nphysical simulation (which is necessarily used for design of every RSFQ gate) in order to\nimprove its quality and precision. The new model for the JJ includes additional inductances,\nwhich must reflect a specific environment of the junction layout. The influence of parameter\ndeviations was investigated in the simulation. As sources of the deviation we chose the\nspread of c (the Stewart-McCumber parameter) and that of the inductances. Then the\noperational margins of the basic elements of the RSFQ logic SR flip-flop were determined\nand compared with the prediction of the previously used model. To prove the results of\nsimulations we designed a test structure of the SR flip-flop, with c=1 and c=2 for the wellestablished\nHYPRES technology (USA).\nAnother part of the work is practical measurements. A test chip, containing chains of 100\nJosephson junctions was designed and measured in order to estimate the spread of critical\ncurrents in real technology.
Josephson junctions (JJs) with non-hysteretic I-V characteristic and high critical parameters are required for many applications; in particular, they are needed to create tunable THz range oscillators. We fabricated and studied shunted superconductor-insulator-superconductor (SIS) Nb-AlOx-Nb tunnel junctions with an area of about 1μm2, estimated their parameters, and compared them with theoretical models. To assess the performance of shunted junctions in the terahertz range, their characteristics were studied under the influence of a high-frequency signal; the estimated value of the characteristic voltage for the shunted junction at a high frequency is about 1 mV. To improve the circuit parameters, a new type of the shunting based on application of NIS junctions was proposed, which reduces the influence of parasitic inductance, expands the frequency range of the generator, and decreases the size of the structure. The JJs with a new type of shunting have been fabricated and studied. The niobium integrated circuits intended for matching the superconducting oscillator and an SIS junction as a microwave detector were designed, fabricated, and tested. Such structures are required for studying the spectral characteristics and analyzing the operation of the oscillator. The developed circuits have demonstrated efficient operation at frequencies from 300 to 700 GHz; the experimental results are in good agreement with the simulated characteristics. The results obtained will be implemented for further development of the THz range oscillators.
A major restriction in the development of a working Rapid Single Flux Quantum (RSFQ) logic circuit with high-Tc superconductors is given by the influence of thermal noise. This gives reason to ask for a general determination of the digital bit error rate. As other approaches, our method of calculating the switching probability is based on the Fokker-Planck equation. In the past few years the bit error rates for a single Josephson junction, SQUIDs and the comparator were calculated by using this theory. We demonstrate numerical solution of the multidimensional Fokker-Planck equation to calculate bit error rates due to thermal noise for a Toggle Flip Flop circuit. In the present work, we combine thermal noise analysis with the effects of process variations in order to derive rules for designing high-Tc RSFQ logic circuits.
The application of high temperature superconductor (HTS) Josephson junctions in digital rapid single flux quantum circuits requires a careful study of the influence of thermal noise on the bit error rate (BER). We have determined experimentally, for the first time, the BER of a HTS rapid single flux quantum circuit. A comparator, formed by two Josephson junctions, was integrated in a Josephson transmission line ring oscillator, allowing us to perform high speed testing of the comparator at GHz frequencies. For fabrication, focused-electron-beam-irradiated junctions have been used because of their small parameter spread and excellent alignment possibilities. A BER of less than 10−11 was obtained at 39 K.