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Journal of Applied Optics

STUDY ON THE ABSOLUTE MEASUREMENT METHOD OF INFRARED SPECTRAL RADIANCE

Li Sun

Published Jan 1, 1999• 0 citations
OpenAlex

Abstract

The generation mechanism of spontaneous parametric down conversion(SPDC)biphoton field is discussed theoretically.The correlated photons produced in the SPDC process have been used in the absolute measurement of infrared spectral radiance.The measurement principle and method are introduced.

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A new method of absolute measurement of photodetector quantum efficiency based on spontaneous parametric down- conversion (SPDC) biphoton field is discussed. The process of SPDC is studied theoretically. The single photon detection probability and two-photon coincidence probability are derived and the measurement principle of photodetectors is explained. An experimental system has been set up. The quantum efficiency of a photon-counting photomultiplier tube was measured, and the results were compared with that obtained using conventional method.
A new method of absolute calibration of photodetector sensitivity based on spontaneous parametric down\|conversion(SPDC) biphoton field is described.The process of SPDC is studied theoretically.The single photon detection probability and two\|photon coincidence probability are derived and the calibration principle for photodetectors is explained.An experimental system has been set up.The sensitivity of a photon\|counting photomultiplier tube was measured,and the results were compared with those obtained using conventional method.
Spontaneous parametric down-conversion (SPDC) sources are an important technology for quantum sensing and imaging. We demonstrate a general simulation method, based on modeling from first principles, reproducing the spectrally and spatially resolved absolute counts of a SPDC experiment. By additionally simulating parametric up- and down-conversion processes with thermal photons as well as effects of the optical system we accomplish good agreement with the experimental results. This method is broadly applicable and allows for the separation of contributing processes, virtual characterization of SPDC sources, and enables the simulation of many quantum based applications.