Acta Physica Sinica
Investigation of atom-optical properties of laser focused Cr atomic deposition
LU Xiang-dong, Tongbao Li, Yan Ma, Wang Li-Dong, (1)同济大学物理系,上海 200092; (2)同济大学物理系,上海 200092;桂林电子科技大学电子工程学院,桂林 541004
Abstract
Gating structure of one dimensional Cr layer is experimentally obtained through the technology of laser focused atomic deposition. The periodicity of grating is (212.8±0.2) nm measured by atomic force microscope, which is just equal to half of the wavelength of laser standing-wave field. Then, based on the semiclassical model and numerical calculation of the Adams-Bashforth-Moulton algorithm, both Cr atom motion trajectories are simulated and the atom-optical properties are analyzed at the same experimental conditions. The results show that the analytical results agree well with the experimental results.