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Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)

Spectral characterization of a narrow linewidth, single-frequency 780 nm fiber laser source for atom cooling applications

Alain Mugnier, E. Lemercier, R. Lebref, Mathieu Jacquemet, D. Pureur

Published May 1, 2011• 0 citations
Publisher

Abstract

We propose and experiment in the following an alternative method for laser linewidth determination at 780 nm based on frequency noise spectrum measurement.
DOI
10.1109/cleoe.2011.5943108

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