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Technical Physics

Resonance reflection of light by a thin layer of a dense nonlinear medium

E. V. Timoshchenko, V. A. Yurevich, Yu. V. Yurevich

Published Feb 1, 2013• 3 citations
Publisher

Abstract

The possibility of hysteretic behavior of resonant reflection spectral curves is determined analytically for the conditions of the dipole-dipole interaction and spectral shift of the field. The phase shift of the acting field is associated with the variation of the energy state of a dense resonant medium forming a thin boundary layer. The problem is considered for the parameters of quantum-size structures based on semiconductors used in optics.

DOI
10.1134/s1063784213020254

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The possibility of hysteretic behavior of resonant reflection spectral curves is determined analytically for the conditions of the dipole-dipole interaction and spectral shift of the field. The phase shift of the acting field is associated with the variation of the energy state of a dense resonant medium forming a thin boundary layer. The problem is considered for the parameters of quantum-size structures based on semiconductors used in optics.
We consider a boundary value problem of reflection of a powerful light wave from a dense resonant medium that exhibits intrinsic optical bistability because of the dipole–dipole interaction of two-level atoms. On the basis of analytical solutions and numerical simulations we establish that intrinsic optical bistability results in the dependence of the reflection coefficient on the adiabatically varying intensity of an external field. The reflection coefficient is an oscillating function of the intensity because of the additional reflectivity that is due to a light-induced sharp discontinuity in the nonlinear permittivity of a dense resonant medium.
The field acting on the atoms in a medium is different from the averaged macroscopic field. The problem of the effective local field caused by dipole–dipole interaction has been discussed several times since Lorentz. In describing the nonlinear optical properties of optically thin resonant layers, it is of principal importance to take into consideration the dipole–dipole interaction of the atoms. These effects manifest themselves when certain relations between the parameters of the atomic system and the incident field are fulfilled. The presence of the excitonic lines shows that the dipole–dipole interaction is larger than the homogeneous and inhomogeneous broadenings. This gives reason to hope that the required inequalities are satisfied in such systems. The chapter considers boundary value problem and a linearly polarized plane wave, with amplitude slowly varying during one optical period, falls perpendicularly onto the surface of a plane-parallel, optically thin, resonant layer consisting of two-level atoms.
A study is made of the problem of transmission of light pulses by a boundary of a nonlinear medium under conditions of coherent interaction with matter. It is shown that in the case of a semiinfinite nonlinear medium the reflection coefficient is governed by the linear characteristics of the media in contact so that the boundary-value problem reduces to the Cauchy problem. In another case, when a nonlinear medium is a thin film at the interface between two linear media, it is found that such a film is an almost perfect mirror reflecting weak pulses but it becomes transparent to pulses of sufficiently high intensity and the mirror then modulates the amplitude of such pulses.
The reflection of short optical pulses from the boundary of a resonant medium is investigated theoretically by the coupled system of the Maxwell and optical Bloch equations. In order to describe the reflected wave, the slowly-varying-envelope approximation in space is not exploited. The coherent reflection is shown to be in connection with Dicke superradiance. It takes place if the relaxation time of the polarization is longer than the superradiation time of the atoms in an optically thin boundary layer of the medium. That is why much of the relevant information can be obtained already in the thin-medium limit, which is considered separately. The conditions of strong reflection from an extended medium are similar to the ones found for a thin sample. The transition into the incoherent and stationary regime is discussed.