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Soviet Journal of Quantum Electronics

Hysteretic effects accompanying reflection of waves by absorbing media

M. Yu. Glotova, M. A. Zuev, Aleksandr B Shvartsburg

Published Aug 31, 1992• 0 citations
Publisher

Abstract

A realistic model of a nonlinear medium allowing for linear and nonlinear absorption was used to determine the conditions for amplitude and phase bistability of a reflected wave field. The dependence of the phase hysteresis of the reflected wave on the dissipative properties of the boundary of the medium was analyzed. It was noted that these effects may be applied to control radiation fluxes and to monitor the parameters of the medium.

DOI
10.1070/qe1992v022n08abeh003584

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A realistic model of a nonlinear medium allowing for linear and nonlinear absorption was used to determine the conditions for amplitude and phase bistability of a reflected wave field. The dependence of the phase hysteresis of the reflected wave on the dissipative properties of the boundary of the medium was analyzed. It was noted that these effects may be applied to control radiation fluxes and to monitor the parameters of the medium.
A rigorous solution is given in the plane-wave approximation for the boundary problem of light reflection from the interface between an isotropic medium and a photorefractive crystal with drift-diffusion nonlinearity. The possibility of realizing hysteresis reflection or optical bistability in the system under certain conditions is shown. Analytical expressions are obtained that describe the hysteresis behavior of reflectivity as a function of the angle of incidence or the strength of a constant external electric field applied to the crystal. The results of the study are of interest for the development of devices controlling laser radiation.
The rigorous solution in the plane-wave approximation of the light reflection boundary problem for the interface the isotropic medium - photorefractive crystal with the drift- diffusion nonlinearity mechanism is given. The possibility of the realization of the hysteresis light reflection phenomenon in this case under certain conditions is shown. The analytical expressions describing hysteresis behavior of the reflectivity as a function of the angle of incidence or that of the external electric field strength applied to the crystal are derived. By changing the value and sign of the applied electric field it is possible to transfer system from the total reflection state to the transmission state and vice versa. The obtained results are attractive for the elaboration of the possible devices for laser radiation control and optical information processing.
An analysis is made of the theory of four-wave wavefront reversal allowing for linear absorption and reflection of all the interacting waves from a mirror which forms a second reference wave from the first incident wave. The Born approximation is used to find the optimum thickness of the nonlinear medium giving the maximum reversal coefficient. Conditions for parametric four-wave oscillation with an arbitrary frequency shift are determined and the dependence of the threshold intensity of the incident reference wave on the linear reflection coefficient of the wave-forming mirror is found for a given thickness of the medium in the absence of absorption.