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IEEE Conference on Nanotechnology (IEEE NANO)

Error-Model Driven Analysis of Quantum Circuits Reliability

Oana Boncalo, Mihai Udrescu, Lucian Prodan, Mircea Vlăduţiu, Alexandru Amaricăi

Published Aug 1, 2008• 3 citations
Publisher

Abstract

This paper presents a flexible VHDL simulation framework, meant to analyze the link between the adopted noise model and the quantum circuit fidelity. The key ingredient is the use of fault injection components (i.e. mutants and saboteurs), which are tailored according to the noise model. The evaluation of quantum fault tolerant (FT) schemes is dominated by analytical studies, mostly restricted to independent probabilistic faults. The model adopted herein addresses general noise, which includes: probabilistic faults, amplitude errors, depolarization, amplitude damping, and phase damping. This way, we show that a rigorous CAD analysis for lower levels of FT schemes can be performed. The results can then be used to tune up simulation or analytical parameters for the higher levels. The target of our simulations is a particular quantum network, responsible for generating and verifying the encoded ancilla state |0rangF.

DOI
10.1109/nano.2008.187

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This paper presents a flexible VHDL simulation framework, meant to analyze the link between the adopted noise model and the quantum circuit fidelity. The key ingredient is the use of fault injection components (i.e. mutants and saboteurs), which are tailored according to the noise model. The evaluation of quantum fault tolerant (FT) schemes is dominated by analytical studies, mostly restricted to independent probabilistic faults. The model adopted herein addresses general noise, which includes: probabilistic faults, amplitude errors, depolarization, amplitude damping, and phase damping. This way, we show that a rigorous CAD analysis for lower levels of FT schemes can be performed. The results can then be used to tune up simulation or analytical parameters for the higher levels. The target of our simulations is a particular quantum network, responsible for generating and verifying the encoded ancilla state |0rangF.
This paper proposes a VHDL-based simulation technique for studying the effects of noise on fault tolerant quantum circuits using fault injection. We aimed at an accurate fault modeling using a Hardware Description Language CAD environment that yields relevant results. However, the resources needed for simulated fault injection become prohibitive with the growth of the circuit (i.e. for the worst case simulation resources grow exponentially with the number of qubits). Furthermore, the fault tolerant mechanisms rely on quantum error correction codes and concatenated coding that further increase the complexity of the analyzed circuit. We address these problems, by proposing a multi-phase approach, based on a two-phase simulation for assessing fault tolerance. In the first phase, the basic blocks of the encoded circuit are analyzed with the simulated fault injection methodology, yielding the noise parameters needed during the second phase, when the logical circuit is analyzed. We show that this approach yields a good approximation for noise values lower than 10−2.
The importance of reliability and fault tolerance is paramount in quantum computation. This paper proposes a Fault Tolerance Algorithms and Methodologies (FTAM) assessment technique for quantum circuits, by adopting the saboteur-based Simulated Fault Injection methodology from classical computation. By drawing the inspiration from classical computation, the HDLs were employed for performing fault injection, due to their capacity of behavioral and structural circuit description, including hierarchical features. The cornerstone of this approach is the adaptation of the available quantum computation error models (with the quantum computing features and constraints) to the classical, HDL framework of the simulated fault injection techniques. The experimental simulated fault injection campaign results are consistent with the analytical assessments -from a qualitative point of view - but at the same time they provide a much realistic description.
This paper addresses the problem of evaluating the Fault Tolerance Algorithms and Methodologies (FTAMs) for quantum circuits, by making use of fault injection techniques. The proposed mutant-based fault injection techniques are inspired from their classical counterparts [3][8], and were adapted to the specific features of quantum computation, including the available error models [4][5]. The HDLs were employed in order to perform fault injection, due to their capacity of behavioral and structural circuit description, as well as their hierarchical features. Besides providing a much realistic description, the experimental simulated fault injection campaigns provide quantitative means for quantum fault tolerance assessment.
The importance of reliability and fault tolerance is paramount in quantum computation. This paper proposes a Fault Tolerance Algorithms and Methodologies (FTAM) assessment technique for quantum circuits, by adopting the saboteur-based Simulated Fault Injection methodology from classical computation. By drawing the inspiration from classical computation, the HDLs were employed for performing fault injection, due to their capacity of behavioral and structural circuit description, including hierarchical features. The cornerstone of this approach is the adaptation of the available quantum computation error models (with the quantum computing features and constraints) to the classical, HDL framework of the simulated fault injection techniques. The experimental simulated fault injection campaign results are consistent with the analytical assessments -from a qualitative point of view - but at the same time they provide a much realistic description.
This paper addresses the problem of evaluating the Fault Tolerance Algorithms and Methodologies (FTAMs) designed for quantum systems, by adopting the Simulated Fault Injection methodology from classical computation. Due to their wide spectrum of applications (including quantum circuit simulation) and hierarchical features, the HDLs were employed for performing fault injection, as prescribed by the guidelines of the QUERIST project. At the same time, the injection techniques taken from classical circuit simulation had to be adapted to quantum computation requirements, including the specific quantum error models. The experimental simulated fault injection campaigns are thoroughly described along with the experimental results, which confirm the analytical expectations.
With the intense interest in small, noisy quantum computing devices comes the push for larger, more accurate---and hence more useful---quantum computers. While fully fault-tolerant quantum computers are, in principle, capable of achieving arbitrarily accurate calculations using devices subjected to general noise, they require immense resources far beyond our current reach. An intermediate step would be to construct quantum computers of limited accuracy enhanced by lower-level, and hence lower-cost, noise-removal techniques. This is the motivation for our paper, which looks into fault-tolerant encoded quantum computation targeted at the dominant noise afflicting the quantum device. Specifically, we develop a protocol for fault-tolerant encoded quantum computing components in the presence of amplitude-damping noise, using a 4-qubit code and a recovery procedure tailored to such noise. We describe a universal set of fault-tolerant encoded gadgets and compute the pseudothreshold for the noise, below which our scheme leads to more accurate computation. Our paper demonstrates the possibility of applying the ideas of quantum fault tolerance to targeted noise models, generalizing the recent pursuit of biased-noise fault tolerance beyond the usual Pauli noise models. We also illustrate how certain aspects of the standard fault tolerance intuition, largely acquired through Pauli-noise considerations, can fail in the face of more general noise.