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Physica C Superconductivity

Extraction of material parameters in NbN multilayer technology for RSFQ circuits

Jean-Claude Villégier, Bertrand Delaet, Vincent Larrey, Pascal Febvre, Junwu Tao, G. Angénieux

Published Nov 1, 1999• 16 citations
Publisher
DOI
10.1016/s0921-4534(99)00410-4

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IEEE Transactions on Applied Superconductivity•Jun 1, 1999•14 citations
A frequency dependent inductance estimation has been carried out for Rapid-Single-Flux Quantum (RSFQ) applications in NbN multilayer technology up to frequencies above the NbN gap frequency. For this purpose an extension of the fullwave modified transverse resonance method (MTRM) has been used, in which each superconducting layer is characterized by its complex conductivity according to the BCS derived model of Mattis and Bardeen. Our estimation shows significant influence of the gap frequency on the NbN multilayer structure inductance at high frequencies.
A generic NbN Superconducting Tunnel Junctions (STJ) technology has been developed using conventional substrates (Si and SOI-SIMOX) for making THz spectrometers including SIS receivers and RSFQ logic gates. NbN/MgO/NbN junctions with area of 1 /spl mu/m/sup 2/, Jc of 10 kA/cm/sup 2/ and low sub-gap leakage current (Vm>25 mV) are currently obtained from room temperature sputtered multilayers followed by a post-annealing at 250/spl deg/C. Using a thin MgO buffer layer deposited underneath the NbN electrodes, ensures lower NbN surface resistance values (Rs=7 /spl mu//spl Omega/) at 10 GHz and 4 K. Epitaxial NbN [100] films on MgO [100] with high gap frequency (1.4 THz) have also been achieved under the same deposition conditions at room temperature. The NbN SIS has shown good I-V photon induced steps when LO pumped at 300 GHz. We have developed an 8 levels Al/NbN multilayer process for making 1.5 THz SIS mixers (including Al antennas) on Si membranes patterned in SOI-SIMOX. Using the planarization techniques developed at the Si-MOS CEA-LETI Facility, we have also demonstrated on the possibility of extending our NbN technology to high level RSFQ circuit integration with 0.5 /spl mu/m/sup 2/ junction area, made on large area substrates (up to 8 inches).