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AIP conference proceedings

Dependence of Excess Noise on the Partial Derivatives of Resistance in Superconducting Transition Edge Sensors

N. Jethava, Joel N. Ullom, K. D. Irwin, William Bertrand Doriese, J. A. Beall, G. C. Hilton, Leila R. Vale, Barry L. Zink, Betty Young, Blas Cabrera, Aaron Miller

Published Jan 1, 2009• 21 citations
Publisher
DOI
10.1063/1.3292343

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AIP conference proceedings•Jan 1, 2009•0 citations
Transition-edge sensors (TESs) are two-dimensional superconducting films utilized as highly sensitive detectors of energy or power. These detectors are voltage biased in the superconducting-normal transition where the film resistance is both finite and a strong function of temperature. Unfortunately, the amount of electrical noise observed in TESs exceeds the predictions of existing noise theories. We describe a possible mechanism for the unexplained excess noise, which we term "mixed-down noise." The source is Johnson noise, which is mixed down to low frequencies by Josephson oscillations in devices with a nonlinear current-voltage relationship. We derive an expression for the power spectral density of this noise and show that its predictions agree with measured data.