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arXiv:1907.11343 · Applied Physics Letters

A model for excess Johnson noise in superconducting transition-edge sensors

Abigail L. Wessels, Kelsey M. Morgan, Johnathon D. Gard, Gene C Hilton, John A. B. Mates, C. D. Reintsema, Daniel R. Schmidt, Daniel S. Swetz, Joel N. Ullom, Leila R. Vale, D. A. Bennett

Published May 17, 2021• 18 citations
arXivHTMLPDF

Abstract

Transition-edge sensors (TESs) are two-dimensional superconducting films utilized as highly sensitive detectors of energy or power. These detectors are voltage biased in the superconducting-normal transition where the film resistance is both finite and a strong function of temperature. Unfortunately, the amount of electrical noise observed in TESs exceeds the predictions of existing noise theories. We describe a possible mechanism for the unexplained excess noise, which we term "mixed-down noise." The source is Johnson noise, which is mixed down to low frequencies by Josephson oscillations in devices with a nonlinear current-voltage relationship. We derive an expression for the power spectral density of this noise and show that its predictions agree with measured data.

DOI
10.1063/5.0043369

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Superconductor Science and Technology•Aug 1, 1996•34 citations
Transition-edge sensors (TESs) are two-dimensional superconducting films utilized as highly sensitive detectors of energy or power. These detectors are voltage biased in the superconducting-normal transition where the film resistance is both finite and a strong function of temperature. Unfortunately, the amount of electrical noise observed in TESs exceeds the predictions of existing noise theories. We describe a possible mechanism for the unexplained excess noise, which we term "mixed-down noise." The source is Johnson noise, which is mixed down to low frequencies by Josephson oscillations in devices with a nonlinear current-voltage relationship. We derive an expression for the power spectral density of this noise and show that its predictions agree with measured data.
We present a detailed analysis of the fundamental noise sources in superconducting transition-edge sensors (TESs), ac voltage biased at MHz frequencies and treated as superconducting weak links. We have studied the noise in the resistive transition as a function of bath temperature of several detectors with different normal resistances and geometries. We show that the "excess" noise, typically observed in the TES electrical bandwidth, can be explained by the equilibrium Johnson noise of the quasiparticles generated within the weak link. The fluctuations at the Josephson frequency and higher harmonics contribute significantly to the measured voltage noise at the detector bandwidth through the nonlinear response of the weak link with a sinusoidal current-phase relation.
The noise in superconducting transition-edge sensors (TESs) commonly exceeds simple theoretical predictions. The reason for this discrepancy is presently unexplained. We have measured the amplitude and frequency dependence of the noise in TES sensors with eight different geometries. In addition, we have measured the dependence of the noise on operating resistance, perpendicular magnetic field, and bath temperature. We find that the unexplained noise contribution is inversely correlated with the temperature width of the superconducting-to-normal transition and is reduced by a perpendicular field and in certain geometries. These results suggest paths to improved sensor performance.
We theoretically predict and experimentally observe the onset of weak-link physics in the dynamical response of transition-edge sensors (TESs). We develop a theoretical framework based on a Fokker-Planck description that incorporates both the TESs electrical response, stemming from Josephson phenomena, and the electrothermal effects due to coupling to a thermal bath. Our measurements of a varying dynamic resistance are in excellent agreement with our theory, thereby establishing weak-link phenomena as the main mechanism underlying the operation of TESs. Furthermore, our description enables the calculation of power spectral densities, paving the way for a more thorough investigation of the unexplained ``excess noise'' in long diffusive junctions and TESs reported in recent experiments.
The current noise at the output of a microcalorimeter with a voltage biased superconducting transition edge thermometer is studied in detail. In addition to the two well-known noise sources: thermal fluctuation noise from the heat link to the bath and Johnson noise from the resistive thermometer, a third noise source strongly correlated with the steepness of the thermometer is required to fit the measured noise spectra. Thermal fluctuation noise, originating in the thermometer itself, fully explains the additional noise. A simple model provides quantitative agreement between the observed and calculated noise spectra for all bias points in the superconducting transition.
It has long been recognized that weak-link effects play an important role in transition edge sensors (Sadleir et al., 2010 and Sadleir et al., 2011), especially when the intrinsic transition temperature of the leads is much higher than that of the device itself. The weak-link physics has also been identified as an important complication if the TES is read-out under MHz-range AC bias for multiplexing purposes (Gottardi et al., 2014). More recently, it has been proposed that the commonly observed “excess” Johnson noise could also be explained as a white Johnson noise component that is mixed down into the signal band from higher frequencies via Josephson oscillations on a non-linear I-V relation (Gottardi et al., 2021 and Wessels et al., 2021). In recent experiments with small scale Mo/Au (50μ\muμm length, 15μ\muμm wide) TES devices with Nb leads (fabricated at GSFC) with a small DC bias applied, we have been able to directly observe Josephson oscillations over a kHz to MHz frequency range. The spectrum of the oscillations is well described by a simple damped oscillator model, with its center frequency scaling in direct proportion to the voltage across the TES. The second harmonic is also observed at small bias. If nothing else, we show that the Josephson oscillations provide a straightforward way to determine the value of the shunt-resistor with accuracy of10−4\mathbf {10^{-4}}10−4or better, as well as the offset voltage of the bias circuit. This is complementary to our previous work demonstrating that Shapiro steps in the IV curve induced by AC magnetic fields can be used for shunt resistor calibration (Zhou et al., 2018). Further work will be needed to determine if this effect can be observed in larger TES or those with relatively low-Tc\mathbf {T_{c}}Tc​contacts, where Shapiro steps are too weak to observe. It remains to be seen whether additional insights on the mixed-down Johnson noise can be obtained from a physics-based model of the weak-link.
The subject of electronic noise in high- superconducting Josephson devices and in their applications is considered. Several types of grain boundary junctions, prepared in different ways by four separate international laboratories, are fully characterized in terms of their electrical and noise properties at a range of temperatures, frequencies, magnetic fields and in the presence of microwaves. Similar characterization is carried out for multijunction Josephson flux-flow arrays, and bi-epitaxial SQUIDs. The theory of Likharev and Semenov for thermal noise in low- junctions is adopted as a reference against which excess noise can be identified in high- junctions. It is combined with theoretical models of excess noise based on fluctuations of critical current and resistance to provide accurate fitting of the observed noise curves. It is shown that the normalized levels of critical current and normal resistance fluctuations for all of the junction types examined are remarkably close (typically around and at 100 Hz) and are nearly independent of temperature in the range T = 30 - 80 K. The frequency dependence is close to the universal 1/f law with some deviations due to trapping of charge carriers at discrete states in the tunnelling barrier. Measurements of voltage noise levels and critical current fluctuations in multijunction flux-flow amplifiers, reported for the first time, are consistent with levels in single junctions of the same type. Excess noise is studied as a function of external magnetic field, in a way that has not been previously described. A new interpretation of the magnetic field-dependent noise data indicates that absolute levels of critical current fluctuations are nearly independent of applied magnetic field. This observation does not appear to have been reported elsewhere. It has important implications for the operation of grain boundary Josephson devices in real applications. Voltage noise in the presence of microwave irradiation, at operating points between Shapiro steps, is consistent with a modified form of the Likharev - Semenov equation which takes into account the known level of critical current fluctuations as measured in field-free conditions. The implications of these results for further improvements in device performance are discussed, and directions for further work are suggested.