AIP conference proceedings
Excess Noise in Transition Edge Sensors
Edvige Celasco, F. Gatti, Roberto Eggenhöffner, Massimo Macucci, Giovanni Basso
Abstract
The experimental excess noise observed in the power spectrum of three selected superconducting transition edge sensors is explained in terms of our correlated avalanche model. The agreement confirms that the excess noise characterized by a wide peak in the spectral frequency dependence originates from the dendritic regime in the superconducting state.