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arXiv:2607.27392

Anomalous Microwave Response in YBCO Resonators beyond the Two-Level-System Model

Kaiwen Zheng, Nathan J. Johnson, Nathan T. Thobaben, Sidharth Duthaluru, Haochen Shen, Denae T. Cherry, David S. Wisbey, Kater W. Murch

cond-mat.supr-concond-mat.mes-hallquant-phSubmitted Jul 29, 2026• Announced Jul 31, 2026• 0 citations
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Abstract

We report the microwave response of coplanar-waveguide (CPW) resonators fabricated from $\mathrm{YBa_2Cu_3O_{7-δ}}$ (YBCO) thin films over temperatures from approximately $70~\mathrm{mK}$ to $40~\mathrm{K}$. The resonators exhibit internal quality factors $Q_\mathrm{i}$ in the range of $4\times10^3$ to $10^4$ at 70 mK, which increase to a maximum of approximately $8\times10^3$ to $1.2\times10^4$ near $6~\mathrm{K}$. At low temperatures, both $Q_\mathrm{i}$ and the fractional shift of the resonance frequency $Δf_\mathrm{r}/f_\mathrm{r}$ increases with temperature, qualitatively resembling behavior commonly associated with two-level-system (TLS) defects. However, neither response saturates on the temperature scale set by the resonator frequency, and the loss exhibits no observable microwave-power dependence. We show that low-temperature frequency upturn may be better described by an additional paramagnetic response associated with defect-induced local moments or Andreev bound states, while the low-temperature loss follows an approximately logarithmic temperature dependence whose microscopic origin remains unresolved. These measurements establish the millikelvin performance of patterned YBCO resonators and show that their low-temperature response cannot be understood within the conventional TLS framework alone.

Comments
8 pages, 5 figures

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We have investigated the temperature dependence of microwave losses in the low-power limit and millikelvin temperature range of a thin-film YBa2Cu3O7-x(YBCO) λ/2 coplanar waveguide resonator patterned on a (La0.3Sr0.7) (Al0.65Ta0.35)O3(LSAT) substrate covered by a CeO2seed layer. The unloaded quality factor is mainly governed by the surface resistance of the YBCO film and the dielectric losses caused by resonant absorption due to a bath of two-level fluctuators in the dielectrics. The value of the unloaded quality factor at 20 mK and low power, i.e., Q0≃2000, allows for the realization of YBCO microwave quantum circuits implementing biepitaxial grain-boundary Josephson junctions.
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As superconducting kinetic inductance detectors (KIDs) continue to grow in popularity for sensitive submillimeter detection and other applications, there is a drive to advance toward lower-loss devices. We present measurements of diagnostic thin-film aluminum coplanar waveguide (CPW) resonators designed to inform ongoing KID development at NASA Goddard Space Flight Center. The resonance frequencies span f0f_0f0​ = 3.5-4 GHz and include quarter-wave and half-wave resonators with varying coupling capacitor designs. We present measurements of the device film properties and an analysis of the dominant mechanisms of loss in the resonators measured in a dark environment, demonstrating quality factors of Qi−1≈3.64−8.57 ×10−8Q_i^{-1} \approx 3.64-8.57\ \times 10^{-8}Qi−1​≈3.64−8.57 ×10−8. We observe an enhanced level of suppression in the loss contributions from two-level systems (TLS) at intermediate-to-high read powers, and a regime at these powers and low temperatures where contributions from intrinsic processes Qi−1Q_i^{-1}Qi−1​,other dominate the total loss. We also observe deviations from the standard TLS loss model at low powers and temperatures below 60 mK, and use a modified model to describe this behavior.
High quality factor, i.e. low loss, microwave resonators are important for quantum information storage and addressing. In this work we study the resonance frequency and loss in superconducting coplanar waveguide resonators as a function of power and temperature. We find that there is increased loss at low power and low temperature. The increased loss is attributed to the existence of two-level systems (TLS) at the surfaces, interfaces, and in the bulk of insulators deposited on the structures. We show that both the temperature dependence of the resonant frequency and the power dependence of the loss can be used to find the TLS contribution to the loss. The TLS intrinsic loss tangent derived from the frequency shift data at high power is shown to agree well with the direct loss measurement at low power. The former allows for a relatively fast measurement of the TLS loss. As an example, we measure the properties of amorphous AlOXdeposited on the resonators and find a TLS loss tangent of 1 × 10-3.
Superconducting resonators are widely used in many applications such as qubit readout for quantum computing, and kinetic inductance detectors. These resonators are susceptible to numerous loss and noise mechanisms, especially the dissipation due to two-level systems (TLS) which become the dominant source of loss in the few-photon and low temperature regime. In this study, capacitively-coupled aluminum half-wavelength coplanar waveguide resonators are investigated. Surprisingly, the loss of the resonators is observed to decrease with a lowering temperature at low excitation powers and temperatures below the TLS saturation. This behavior is attributed to the reduction of the TLS resonant response bandwidth with decreasing temperature and power to below the detuning between the TLS and the resonant photon frequency in a discrete ensemble of TLS. When response bandwidths of TLS are smaller than their detunings from the resonance, the resonant response and thus the loss is reduced. At higher excitation powers, the loss follows a logarithmic power dependence, consistent with predictions from the generalized tunneling model (GTM). A model combining the discrete TLS ensemble with the GTM is proposed and matches the temperature and power dependence of the measured internal loss of the resonator with reasonable parameters.
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