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arXiv:2509.07214

Optical field characterization at the fundamental limit of spatial resolution with a trapped ion

Nikhil Kotibhaskar, Sainath Motlakunta, Anthony Vogliano, Hahn, Lewis, Rajibul Islam

Published Sep 8, 2025• 0 citations
arXivHTMLPDF

Abstract

Optical systems capable of generating fields with sub-wavelength spatial features have become standard in science and engineering research and industry. Pertinent examples include atom- and ion-based quantum computers and optical lithography setups. So far, no tools exist to characterize such fields - both intensity and polarization - at sub-wavelength length scales. We use a single trapped atomic ion, confined to approximately 40 nm X 40 nm X 180 nm to sense a laser light field at a wavelength of 370 nm. With its spatial extent smaller than the absorption cross-section of a resonant detector, the ion-sensor operates at the fundamental limit of spatial resolution. Our technique relies on developing an analytical model of the ion-light interaction and using the model to extract the intensity and polarization. An important insight provided in this work is also that the inverse of this model can be learned, in a restricted sense, on a deep neural network, speeding up the intensity and polarization readout by five orders of magnitude. This speed-up makes the technique field-deployable to characterize optical instruments by probing light at the sub-wavelength scale.

DOI
10.48550/arxiv.2509.07214

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Optical systems capable of generating fields with sub-wavelength spatial features have become standard in science and engineering research and industry. Pertinent examples include atom- and ion-based quantum computers and optical lithography setups. So far, no tools exist to characterize such fields - both intensity and polarization - at sub-wavelength length scales. We use a single trapped atomic ion, confined to approximately 40 nm X 40 nm X 180 nm to sense a laser light field at a wavelength of 370 nm. With its spatial extent smaller than the absorption cross-section of a resonant detector, the ion-sensor operates at the fundamental limit of spatial resolution. Our technique relies on developing an analytical model of the ion-light interaction and using the model to extract the intensity and polarization. An important insight provided in this work is also that the inverse of this model can be learned, in a restricted sense, on a deep neural network, speeding up the intensity and polarization readout by five orders of magnitude. This speed-up makes the technique field-deployable to characterize optical instruments by probing light at the sub-wavelength scale.
The paper summarizes on the results of several experiments on single trapped ions which have been used to map optical fields. In these experiments, the ion was placed either in front of a (distant) mirror or in an optical cavity. Sub-wavelength resolution is achieved because the position of the ion relative to the mirror(s) is well-controlled and the ion's spatial wavefunction is confined to a region much smaller than the optical wavelength (400 to 800 nm). This strong localization is due to the trapping potential of a Paul-type ion trap, and laser cooling. In the three experiments the ions were Doppler-cooled, and a resolution between about 10 and 50 nm was achieved. With this resolution, the spatial variation of an optical standing-wave field was detected by shifting the single ion through the field structure.
We realize a scanning probe microscope using single trapped ^{87}Rb atoms to measure optical fields with subwavelength spatial resolution. Our microscope operates by detecting fluorescence from a single atom driven by near-resonant light and determining the ac Stark shift of an atomic transition from other local optical fields via the change in the fluorescence rate. We benchmark the microscope by measuring two standing-wave Gaussian modes of a Fabry-Pérot resonator with optical wavelengths of 1560 and 781 nm. We attain a spatial resolution of 300 nm, which is superresolving compared to the limit set by the 780 nm wavelength of the detected light. Sensitivity to short length scale features is enhanced by adapting the sensor to characterize an optical field via the force it exerts on the atom.
The advent of the quantum gas microscope allowed for the in situ probing of ultracold gaseous matter on an unprecedented level of spatial resolution.However, the study of phenomena on ever smaller length scales, as well as the probing of three-dimensional systems, is fundamentally limited by the wavelength of the imaging light for all techniques based on linear optics.Here, we report on a high-resolution ion microscope as a versatile and powerful experimental tool to investigate quantum gases.The instrument clearly resolves atoms in an optical lattice with a spacing of 532 nm over a field of view of 50 sites and offers an extremely large depth of field on the order of at least 70 μm.With a simple model, we extract an upper limit for the achievable resolution of approximately 200 nm from our data.We demonstrate a pulsed operation mode enabling 3D imaging and allowing for the study of ionic impurities and Rydberg physics.
Quantum gas microscopes have become a major element for quantum simulations using ultra-cold atoms in optical lattices. They are for example used to observe long-range order such as anti-ferromagnetic correlations in far field optical lattices using density and spin resolved microscopy. Decreasing the period of such lattice offer interesting perspective to increase atom-atom interaction energies and engineer atom-light coupling that our group tackles via the hybridization of cold atoms and nano-structured surfaces.In this poster, we will present how such type of sub-wavelength lattice potentials can be generated by trapping atoms in proximity (tens to hundreds of nanometers) of a nano-structured surface. At such atom to surface distance, the attractive Casimir-Polder force can be compensated by a doubly dressed state trapping method that I will discuss. Such method additionally offers solutions to overcome the diffraction limit of conventional imaging that become critical for sub-wavelength lattices. In this work, I will present the experimental characterization of a sub-wavelength resolution absorption imaging applicable to quantum gas detection. This method requires a quantitative determination of the atom number of dense clouds which has been characterized in this work and demonstrate that the scattering cross section reduces linearly with the optical density. Modelling the propagation of light in dense cloud we show that this reduction can be attributed to re-scattering of the incoherent part of the resonant fluorescence spectrum.The poster will additionally present an update on our recent work on the spectroscopy of Acetylene in sealed hollow core fibers.
Sub-micrometer light patterns play a pivotal role in biology, biophysics, and AMO physics, yet their in situ characterization is limited in spatial resolution and sensitivity. Here, we present an atom camera with a single ultracold atom in an optical tweezer as a scanning probe. Measuring the energy shift on the spin states with the long coherence time and polarization-sensitive transitions yields highly sensitive, high-resolution 2D imaging of both intensity and polarization ellipticity. We characterize the polarization of a tightly-focused beam, observing its non-trivial profile. The spatial resolution is fundamentally limited by the atom’s position uncertainty, suppressed down to quantum fluctuations (~25 nm) in the motional ground state of the tweezer, with an experimentally obtained upper bound of σ ≤ 96(4) nm. This method enables imaging beyond the diffraction limit, surpassing previous approaches limited by thermal fluctuations of the atom, and provides a powerful tool for designing and analyzing submicron-scale light patterns. In situ super-resolution imaging of light has inherent limitations when applied to the polarization profile. Here, the authors introduce an “atom camera” approach by means of a single tweezer-trapped 87Rb atom measuring the field-induced shifts at sub-micrometer steps, achieving resolution beyond the optical diffraction limit.
Laser-driven operations are a common approach for engineering one- and two-qubit gates in trapped-ion arrays. Measuring key parameters of these lasers, such as beam sizes, intensities, and polarizations, is central to predicting and optimizing gate speeds and stability. Unfortunately, it is challenging to accurately measure these properties at the ion location within an ultra-high vacuum chamber. Here, we demonstrate how the ions themselves may be used as sensors to directly characterize the laser beams needed for quantum gate operations. Making use of the four-photon Stark Shift effect in 171Yb+ ions, we measure the profiles, alignments, and polarizations of the lasers driving counter-propagating Raman transitions. We then show that optimizing the parameters of each laser individually leads to higher-speed Raman-driven gates with smaller susceptibility to errors. Our approach demonstrates the capability of trapped ions to probe their local environments and to provide useful feedback for improving system performance.