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European Quantum Electronics Conference (EQEC)

Sub-wavelength resolution of optical fields probed by single atoms

Jürgen Eschner

Published Jan 1, 2003• 0 citations
Publisher

Abstract

The paper summarizes on the results of several experiments on single trapped ions which have been used to map optical fields. In these experiments, the ion was placed either in front of a (distant) mirror or in an optical cavity. Sub-wavelength resolution is achieved because the position of the ion relative to the mirror(s) is well-controlled and the ion's spatial wavefunction is confined to a region much smaller than the optical wavelength (400 to 800 nm). This strong localization is due to the trapping potential of a Paul-type ion trap, and laser cooling. In the three experiments the ions were Doppler-cooled, and a resolution between about 10 and 50 nm was achieved. With this resolution, the spatial variation of an optical standing-wave field was detected by shifting the single ion through the field structure.

DOI
10.1109/eqec.2003.1314179

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The paper summarizes on the results of several experiments on single trapped ions which have been used to map optical fields. In these experiments, the ion was placed either in front of a (distant) mirror or in an optical cavity. Sub-wavelength resolution is achieved because the position of the ion relative to the mirror(s) is well-controlled and the ion's spatial wavefunction is confined to a region much smaller than the optical wavelength (400 to 800 nm). This strong localization is due to the trapping potential of a Paul-type ion trap, and laser cooling. In the three experiments the ions were Doppler-cooled, and a resolution between about 10 and 50 nm was achieved. With this resolution, the spatial variation of an optical standing-wave field was detected by shifting the single ion through the field structure.
Optical systems capable of generating fields with sub-wavelength spatial features have become standard in science and engineering research and industry. Pertinent examples include atom- and ion-based quantum computers and optical lithography setups. So far, no tools exist to characterize such fields - both intensity and polarization - at sub-wavelength length scales. We use a single trapped atomic ion, confined to approximately 40 nm X 40 nm X 180 nm to sense a laser light field at a wavelength of 370 nm. With its spatial extent smaller than the absorption cross-section of a resonant detector, the ion-sensor operates at the fundamental limit of spatial resolution. Our technique relies on developing an analytical model of the ion-light interaction and using the model to extract the intensity and polarization. An important insight provided in this work is also that the inverse of this model can be learned, in a restricted sense, on a deep neural network, speeding up the intensity and polarization readout by five orders of magnitude. This speed-up makes the technique field-deployable to characterize optical instruments by probing light at the sub-wavelength scale.
We realize a scanning probe microscope using single trapped ^{87}Rb atoms to measure optical fields with subwavelength spatial resolution. Our microscope operates by detecting fluorescence from a single atom driven by near-resonant light and determining the ac Stark shift of an atomic transition from other local optical fields via the change in the fluorescence rate. We benchmark the microscope by measuring two standing-wave Gaussian modes of a Fabry-Pérot resonator with optical wavelengths of 1560 and 781 nm. We attain a spatial resolution of 300 nm, which is superresolving compared to the limit set by the 780 nm wavelength of the detected light. Sensitivity to short length scale features is enhanced by adapting the sensor to characterize an optical field via the force it exerts on the atom.
We optically detect the positions of single neutral cesium atoms stored in a standing wave dipole trap with a sub-wavelength resolution of 105 nm. The distance between two simultaneously trapped atoms is measured with an even higher precision of 55 nm. We resolve the discreteness of the interatomic distances due to the 532 nm spatial period of the standing wave potential and infer the exact number of trapping potential wells separating the atoms. Finally, combining an initial position detection with a controlled transport, we place single atoms at a predetermined position along the trap axis to within 300 nm.
A microfabricated phase Fresnel lens was used to image ytterbium ions trapped in a radio frequency Paul trap. The ions were laser cooled close to the Doppler limit on the 369.5 nm transition, reducing the ion motion so that each ion formed a near point source. By detecting the ion fluorescence on the same transition, near-diffraction-limited imaging with spot sizes of below 440 nm (FWHM) was achieved. To our knowledge, this is the first demonstration of wavelength-scale imaging of trapped ions and the highest imaging resolution ever achieved with atoms in free space.
We report one-dimensional pinning of a single ion by an optical lattice. A standing-wave cavity produces the lattice potential along the rf-field-free axis of a linear Paul trap. The ion's localization is detected by measuring its fluorescence when excited by standing-wave fields with the same period, but different spatial phases. The experiments agree with an analytical model of the localization process, which we test against numerical simulations. For the best localization achieved, the ion's average coupling to the cavity field is enhanced from 50% to 81(3)% of its maximum possible value, and we infer that the ion is bound in a lattice well with over 97% probability.
The center-of-mass position of a single trapped atomic ion is measured and tracked in time with high precision. Employing a near-resonant radio frequency field of wavelength 2.37 cm and a static magnetic field gradient of 19 T/m, the spatial location of the ion is determined with an unprecedented wavelength-relative resolution of 5 ×\times× 10−9^{-9}−9, corresponding to an absolute precision of 0.12 nm. Measurements of an electrostatic force on a single ion demonstrate a sensitivity of 2.2 ×\times× 10−23 N/Hz^{-23} ~\text{N}/\sqrt{\text{Hz}}−23 N/Hz​. The real-time measurement of an atom's position complements the well-established technique of scanning near-field radio frequency transmission microscopy and opens up a novel route to using this method with path breaking spatial and force resolution.