arXiv:2403.11458
Pulsed loading of a magneto-optical trap on atom chip for fast pressure recovery in ultrahigh vacuum environment
Singh, Vivek, Vibhuti Bhushan Tiwari, A. Chaudhary, Sarkar, S., S. R. Mishra
Abstract
This study presents investigations on pulsed loading of a magneto-optical trap (MOT) on an atom chip in an UHV environment. Using three parallel resistively heated Rb-metal dispensers activated by pulsed current supply, approximately 3.0 $\times$ $10^{7}$ cold $^{87}Rb$ atoms were loaded into the MOT. A current pulse of $\sim$ 24 A with duration of $\sim$ 10 s raised the pressure in the chamber from 2.0 $\times$ $10^{-10}$ Torr to 3.3 $\times$ $10^{-10}$ Torr. Remarkably, the pressure recovery time after switching off the dispensers current was found to be $\sim$ 600 ms, making a significant advancement in achieving fast recovery of UHV environment surrounding the MOT region. This study is very useful for laser cooling and magnetic trapping / evaporative cooling of atoms on atom chip in the same UHV chamber.