arXiv:1912.00503 · IEEE Transactions on Applied Superconductivity
Study of Microwave Resonances Induced by Bias Lines of Shunted Josephson Junctions
Uğur Yılmaz, Sasan Razmkhah, Romain Collot, J. Kunert, Ronny Stolz, Pascal Febvre
Abstract
Bias lines routed over a ground plane naturally form microstrip lines associated with the presence of a capacitance. This can lead to unwanted resonances when coupled to Josephson junctions. This article presents an electrical model of a shunted Josephson junction with its bias lines and pads, fabricated with the 1 kA/cm2rapid single flux quantum niobium process of the FLUXONICS foundry (J. Kunert, 2013), (J. Kunert, 2017). A T-model is used to simulate the microwave behavior of the bias line, predict resonances and design resonance-free superconducting circuits. The I-V characteristics of three shunted Josephson junctions have been obtained from time-domain simulations done with Josephson SIMulator (JSIM) (E. S. Fang and T. Van Duzer, 1989) and show a good match with the experimentally observed resonance at 230 GHz up to the normal resistance branch, measured at 4.2 K. The influence of the position and value of a series resistor placed on bias lines is studied to damp unwanted resonances at the junction.