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arXiv:0910.1315 · Physical Review A

Gate fidelity fluctuations and quantum process invariants

Easwar Magesan, Robin Blume-Kohout, Joseph Emerson

Published Jul 11, 2011• 60 citations
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Abstract

We characterize the quantum gate fidelity in a state-independent manner by giving an explicit expression for its variance. The method we provide can be extended to calculate all higher order moments of the gate fidelity. Using these results, we obtain a simple expression for the variance of a single-qubit system and deduce the asymptotic behavior for large-dimensional quantum systems. Applications of these results to quantum chaos and randomized benchmarking are discussed.

DOI
10.1103/physreva.84.012309

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We characterize the quantum gate fidelity in a state-independent manner by giving an explicit expression for its variance. The method we provide can be extended to calculate all higher order moments of the gate fidelity. Using these results, we obtain a simple expression for the variance of a single-qubit system and deduce the asymptotic behavior for large-dimensional quantum systems. Applications of these results to quantum chaos and randomized benchmarking are discussed.
Randomized benchmarking (RB) protocols have become an essential tool for providing a meaningful partial characterization of experimental quantum operations. While the RB decay rate is known to enable estimates of the average fidelity of those operations under gate-independent Markovian noise, under gate-dependent noise this rate is more difficult to interpret rigorously. In this paper, we prove that single-qubit RB decay parameter p coincides with the decay parameter of the gate-set circuit fidelity , a novel figure of merit which characterizes the expected average fidelity over arbitrary circuits of operations from the gate-set. We also prove that, in the limit of high-fidelity single-qubit experiments, the possible alarming disconnect between the average gate fidelity and RB experimental results is simply explained by a basis mismatch between the gates and the state-preparation and measurement procedures, that is, to a unitary degree of freedom in labeling the Pauli matrices. Based on numerical evidence and physically motivated arguments, we conjecture that these results also hold for higher dimensions.
Gate fidelity -- an average fidelity over all possible input states -- is the workhorse metric for benchmarking quantum gates or circuits, yet fault-tolerant quantum computing ultimately depends on the worst-case behavior, typically quantifiable by so-called the diamond distance. In the low-error regime, the coherent errors can inflate the worst-case error even when the reported gate fidelity is high, making the gate fidelity alone an unreliable proxy for fault-tolerance readiness. To capture the missing information, we introduce a companion observable -- what we dub the fidelity deviation -- that quantifies how strongly the state-dependent fidelities fluctuate across input states. Adopting such fluctuations in assessing the fault-tolerance is physically natural because some input directions are nearly unaffected while others form narrow "valleys" that dominate adversarial circuit behavior. For coherent (unitary) gate errors on two or more qubits, we show that the gate fidelity together with the fidelity deviation constrains the relevant spectral moments of the error unitary, enabling an explicit and tight certificate of the worst-case error. Both quantities are estimated directly from the same randomized input-measurement experiment, without full process tomography. We show that the fidelity and its deviation can provide an economical, operationally meaningful, and accurate standard for assessing the fault tolerance of the engineered quantum gates and circuits.
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Randomized benchmarking (RB) protocols have become an essential tool for providing a meaningful partial characterization of experimental quantum operations. While the RB decay rate is known to enable estimates of the average fidelity of those operations under gate-independent Markovian noise, under gate-dependent noise this rate is more difficult to interpret rigorously. In this paper, we prove that single-qubit RB experiments provide direct estimates of the gateset circuit fidelity, a novel figure of merit which characterizes the expected average fidelity over arbitrary circuits of operations from the gateset. We also prove that, in the limit of high-fidelity single-qubit experiments, the difficulty introduced by gate-dependence reduces to a basis mismatch between the gates and the state-preparation and measurement procedures, that is, to a unitary degree of freedom in labeling the Pauli matrices. Based on numerical evidence and physically motivated arguments, we conjecture that these result hold for higher dimensions.
Cross-entropy benchmarking (XEB) with single-qubit reference sequences is widely used to characterize multi-qubit gates in large-scale quantum processors, despite the lack of a rigorous theoretical justification. Here we show that the commonly employed additive single-qubit errors approximation underlying this approach breaks down and leads to a systematic overestimation of gate fidelities. We derive an analytical expression for the joint decay of simultaneous single-qubit reference sequences, identify when interleaved circuits generate sufficient randomization for the standard depolarizing approximation, and obtain a refined expression for the interleaved gate fidelity estimation. Experiments on a superconducting quantum processor validate the theory and demonstrate that fidelities obtained using XEB with single-qubit references agree with those extracted from standard interleaved randomized benchmarking (IRB), while achieving higher precision due to reduced reference-sequence errors. Our results establish theoretical foundation for interleaved benchmarking protocols employing single-qubit reference sequences and show that, with appropriate post-processing, they provide a simple and accurate alternative to multi-qubit Clifford reference circuits.