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arXiv:2603.07495

Sharpening Worst-Case Error Assessment for Fault-Tolerant Quantum Computing: Fidelity and Its Deviation

Kyoungho Cho, Ilkwon Sohn, Yongsoo Hwang, Jeongho Bang

quant-phSubmitted Mar 8, 2026• Announced Mar 10, 2026• 0 citations
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Abstract

Gate fidelity -- an average fidelity over all possible input states -- is the workhorse metric for benchmarking quantum gates or circuits, yet fault-tolerant quantum computing ultimately depends on the worst-case behavior, typically quantifiable by so-called the diamond distance. In the low-error regime, the coherent errors can inflate the worst-case error even when the reported gate fidelity is high, making the gate fidelity alone an unreliable proxy for fault-tolerance readiness. To capture the missing information, we introduce a companion observable -- what we dub the fidelity deviation -- that quantifies how strongly the state-dependent fidelities fluctuate across input states. Adopting such fluctuations in assessing the fault-tolerance is physically natural because some input directions are nearly unaffected while others form narrow "valleys" that dominate adversarial circuit behavior. For coherent (unitary) gate errors on two or more qubits, we show that the gate fidelity together with the fidelity deviation constrains the relevant spectral moments of the error unitary, enabling an explicit and tight certificate of the worst-case error. Both quantities are estimated directly from the same randomized input-measurement experiment, without full process tomography. We show that the fidelity and its deviation can provide an economical, operationally meaningful, and accurate standard for assessing the fault tolerance of the engineered quantum gates and circuits.

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48 pages (main text + supplementary information)

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Gate fidelity -- an average fidelity over all possible input states -- is the workhorse metric for benchmarking quantum gates or circuits, yet fault-tolerant quantum computing ultimately depends on the worst-case behavior, typically quantifiable by so-called the diamond distance. In the low-error regime, the coherent errors can inflate the worst-case error even when the reported gate fidelity is high, making the gate fidelity alone an unreliable proxy for fault-tolerance readiness. To capture the missing information, we introduce a companion observable -- what we dub the fidelity deviation -- that quantifies how strongly the state-dependent fidelities fluctuate across input states. Adopting such fluctuations in assessing the fault-tolerance is physically natural because some input directions are nearly unaffected while others form narrow "valleys" that dominate adversarial circuit behavior. For coherent (unitary) gate errors on two or more qubits, we show that the gate fidelity together with the fidelity deviation constrains the relevant spectral moments of the error unitary, enabling an explicit and tight certificate of the worst-case error. Both quantities are estimated directly from the same randomized input-measurement experiment, without full process tomography. We show that the fidelity and its deviation can provide an economical, operationally meaningful, and accurate standard for assessing the fault tolerance of the engineered quantum gates and circuits.
Abstract Contemporary methods for benchmarking noisy quantum processors typically measure average error rates or process infidelities. However, thresholds for fault-tolerant quantum error correction are given in terms of worst-case error rates—defined via the diamond norm—which can differ from average error rates by orders of magnitude. One method for resolving this discrepancy is to randomize the physical implementation of quantum gates, using techniques like randomized compiling (RC). In this work, we use gate set tomography to perform precision characterization of a set of two-qubit logic gates to study RC on a superconducting quantum processor. We find that, under RC, gate errors are accurately described by a stochastic Pauli noise model without coherent errors, and that spatially correlated coherent errors and non-Markovian errors are strongly suppressed. We further show that the average and worst-case error rates are equal for randomly compiled gates, and measure a maximum worst-case error of 0.0197(3) for our gate set. Our results show that randomized benchmarks are a viable route to both verifying that a quantum processor’s error rates are below a fault-tolerance threshold, and to bounding the failure rates of near-term algorithms, if—and only if—gates are implemented via randomization methods which tailor noise.
Benchmarking physical devices and verifying logical algorithms are important tasks for scalable fault-tolerant quantum computing. Numerous protocols exist for benchmarking devices before running actual algorithms. In this work, we show that both physical and logical errors of fault-tolerant circuits can even be characterized in-situ using syndrome data. To achieve this, we map general fault-tolerant Clifford circuits to subsystem codes using the spacetime code formalism and develop a scheme for estimating Pauli noise in Clifford circuits using syndrome data. We give necessary and sufficient conditions for the learnability of physical and logical noise from given syndrome data, and show that we can accurately predict logical fidelities from the same data. Importantly, our approach requires only a polynomial sample size, even when the logical error rate is exponentially suppressed by the code distance, and thus gives an exponential advantage against methods that use only logical data such as direct fidelity estimation. We demonstrate the practical applicability of our methods in various scenarios using synthetic data as well as the experimental data from a recent demonstration of fault-tolerant circuits by Bluvstein et al. [Nature 626, 7997 (2024)]. Our methods provide an efficient, in-situ way of characterizing a fault-tolerant quantum computer to help gate calibration, improve decoding accuracy, and verify logical circuits.
We derive a universal performance limit for coherent quantum control in the presence of modeled and unmodeled uncertainties. For any target unitary WWW that is implementable in the absence of error, we prove that the worst-case (and hence the average) gate fidelity obeys the lower bound $F \ge \Flb\bigl(\tf \Omeff\bigr)$, where $\tf$ is the gate duration and $\Omeff$ is a single frequency-like measure that aggregates \emph{all} bounded uncertainty sources, e.g., coherent control imperfections, unknown couplings, and residual environment interactions, without assuming an initially factorizable system-bath state or a completely positive map. The bound is obtained by combining an interaction-picture averaging method with a Bellman-Gronwall inequality and holds for any finite-norm Hamiltonian decomposition. Hence it applies equally to qubits, multi-level qudits, and ancilla-assisted operations. Because $\Flb$ depends only on the dimensionless product $\tf\Omeff$, it yields a device-independent metric that certifies whether a given hardware platform can, in principle, reach a specified fault-tolerance threshold, and also sets a quantitative target for robust-control synthesis and system identification.
Can a high-quality quantum gate be certified when uncharacterized state-preparation and measurement errors are dominant? Can this be achieved with low experimental overhead? Here, we introduce a sound black-box certification protocol for a single-qubit gate based on a small set of fixed, deterministic sequences. From the data, the protocol derives finite-sample bounds on the gate's rotation eigenvalue, a gauge-invariant property. Its phase reveals the accuracy of the rotation angle, while its modulus quantifies the loss of coherence under repeated gate applications. We implement the protocol on a 40Ca+^{40}\mathrm{Ca}^{+}40Ca+ trapped-ion processor and certify the X\sqrt{\mathrm{X}}X​-gate rotation eigenvalue using 22 00022\,00022000 circuit executions, and demonstrate the robustness of certification to state-preparation and measurement errors by deliberately degrading the readout. Finally, we prove that these spectral constraints imply, up to a physically meaningful unitary change of basis, a rigorous average gate-fidelity lower bound for every time-independent qubit model compatible with the data. In both readout settings, the spectral bounds yield the same fidelity certificate of 99.94(3)%99.94(3)\%99.94(3)% with 99%99\%99% confidence. Our results establish a new standard for quantum-gate certification by combining soundness and experimental efficiency without requiring trusted reference operations, randomized circuits, or model fitting.
Present-day quantum processors are open systems in which dissipation and decoherence degrade the information carried by a quantum state as it propagates through a circuit. We study this degradation in dissipative random quantum circuits, modeling each two-qubit gate as a diluted unitary that interpolates between the intended unitary operation and a random dissipative quantum channel. Using the fidelity between the ideal and noisy output states as a diagnostic, we show that sufficiently random unitary gates or dissipative Kraus operators lead to a universal decay of the average fidelity. This decay is determined only by the dissipation strength, system size, and circuit depth, while microscopic details of the gates and noise, including the Kraus rank, appear only in subleading corrections to higher moments. We derive a closed-form expression for the average fidelity in terms of three physically meaningful error parameters, dissipation strength, coherent two-qubit gate-error strength, and connectivity-error probability. Finally, we identify the cases when dissipative effects can be reproduced by an unitary-noise model and when dissipation-induced decoherence remains distinguishable from coherent noise at the level of the average fidelity.
We present a general framework for the quantification and characterization of leakage errors that result when a quantum system is encoded in the subspace of a larger system. To do this we introduce metrics for quantifying the coherent and incoherent properties of the resulting errors and we illustrate this framework with several examples relevant to superconducting qubits. In particular, we propose two quantities, the leakage and seepage rates, which together with average gate fidelity allow for characterizing the average performance of quantum gates in the presence of leakage and show how the randomized benchmarking protocol can be modified to enable the robust estimation of all three quantities for a Clifford gate set.